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- W2520245713 abstract "Since the structure and function of IC (Integrated Circuit) is becoming complicated, locating the defect precisely is facing more challenges. Non-destructive analysis strategy would be much more important than ever before. This paper would present an efficient strategy to locate the defect on capacitor with simulation EMMI analysis. This non-destructive strategy can be considered when meet the output signal failed which with complicated feedback circuit." @default.
- W2520245713 created "2016-09-23" @default.
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- W2520245713 date "2016-07-01" @default.
- W2520245713 modified "2023-09-26" @default.
- W2520245713 title "Simulation assisting EMMI technical to locate defect on capacitor in integrated circuit failure analysis" @default.
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- W2520245713 doi "https://doi.org/10.1109/ipfa.2016.7564287" @default.
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