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• W2523844575 abstract "We subjected P3HT:PCBM solar cells to electrical constant current stress and thermal storage. We employed the impedance spectroscopy technique combined to conventional DC measurements for device characterization during all stresses. We identified and separated different contributions affecting the open circuit voltage and short circuit current. Several mechanisms are behind these changes during the stresses; in particular, we underlined the exciton recombination rate and the variation of the built-in voltage." @default.
• W2523844575 created "2016-10-07" @default.
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• W2523844575 date "2016-04-01" @default.
• W2523844575 modified "2023-09-26" @default.
• W2523844575 title "Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell" @default.
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• W2523844575 doi "https://doi.org/10.1109/irps.2016.7574523" @default.
• W2523844575 hasPublicationYear "2016" @default.
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