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- W2524127596 abstract "Trapped charges at oxide interfaces in field effect transistors are well known sources of noise and generally degrade the device performance. At low temperatures, operating in the sub-threshold regime, conduction electrons can be confined to percolation pathways [1]. The scattering potential produced by trapped charge can then have a dramatic effect on the conductance, normally observed as random telegraph noise [2]. Here we show that it is possible to coherently excite the trapped electrons with microwave fields, which induce polarization fields that interact with the percolating electrons, measured as high-quality resonances (Q ∼ 104 – 105) in the transistor current. Implementing single-shot measurements gives the possibility to study the dynamics of the trapped electrons, and using a standard Ramsey protocol, coherent control is achieved. Given the long coherence times observed (T 2 ∼ 10 µs) and since each resonance can be addressed independently in frequency space, the possibility to use such systems as quantum memories or quantum bits is discussed." @default.
- W2524127596 created "2016-10-07" @default.
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- W2524127596 date "2016-06-01" @default.
- W2524127596 modified "2023-09-26" @default.
- W2524127596 title "Coherent control of trapped-charge induced resonances in a field-effect transistor" @default.
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- W2524127596 doi "https://doi.org/10.1109/snw.2016.7577969" @default.
- W2524127596 hasPublicationYear "2016" @default.
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