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- W2526699541 abstract "NAND Flash memories are complex systems that include many heterogeneous blocks that must work together to ensure a high reliability of the information storage. Many efforts in the reliability community are devoted to investigate the reliability-loss of this storage medium from a cell device physics point of view, whereas little importance is given to the other blocks that constitute such a system. In this work we present a reliability threat related to NAND Flash memories that is present on the high voltage circuitry of the memory: the dependence on the power supply. Through the experimental characterization of TLC mid-1X samples and thanks to the SPICE simulations of the high voltage blocks we have investigated the possible sources of this new reliability issue." @default.
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- W2526699541 date "2016-04-01" @default.
- W2526699541 modified "2023-09-27" @default.
- W2526699541 title "Power-supply impact on the reliability of mid-1X TLC NAND flash memories" @default.
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- W2526699541 doi "https://doi.org/10.1109/irps.2016.7574509" @default.
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