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• W2527069540 abstract "The very faint spontaneous near-infrared photon emission of scaled SOI FETs fabricated in 32 nm planar and 14 nm FinFET technologies is characterized and modeled for the first time. A high sensitivity and low noise detector is leveraged to measure emission at low voltages, including sub-threshold and linear regions that are extremely faint. Furthermore, the effect of device threshold is studied and modeled for the first time by comparing the emission from FETs with different Vt." @default.
• W2527069540 created "2016-10-07" @default.
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• W2527069540 date "2016-04-01" @default.
• W2527069540 modified "2023-09-25" @default.
• W2527069540 title "Spontaneous photon emission from 32 nm and 14 nm SOI FETs" @default.
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• W2527069540 doi "https://doi.org/10.1109/irps.2016.7574577" @default.
• W2527069540 hasPublicationYear "2016" @default.
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