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• W2529483407 abstract "Radiation effects in ICs have been a hot topic in the reliability area for a long time. In the sub-lOOnm process technology, the Single-Event Effect (SEE) becomes most critical, and the modeling of Single-Event pulse is an important and challenging issue. In this paper a compact model of Single-Event pulse has been developed with VerilogA behavioral language. This model has also been used for the Radiation-Hardened (RH) circuit validation. A VerilogA compact model could link the device level radiation effects to the circuit level simulation and be efficient for the RH circuit design." @default.
• W2529483407 created "2016-10-14" @default.
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• W2529483407 date "2016-05-01" @default.
• W2529483407 modified "2023-10-03" @default.
• W2529483407 title "Modeling of single event pulse with verilog A: Implementation and application" @default.
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• W2529483407 doi "https://doi.org/10.1109/inec.2016.7589294" @default.
• W2529483407 hasPublicationYear "2016" @default.
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