FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2530902762> ?p ?o ?g. }

• W2530902762 endingPage "1603" @default.
• W2530902762 startingPage "1595" @default.
• W2530902762 abstract "The continuing increase of functionality, miniaturization, and affordability of handheld electronic devices has resulted in a decrease in the size and weight of the products. As a result, printed wiring assemblies (PWAs) have become thinner and more flexible, and clearances with surrounding structures have decreased. Therefore, new design rules are needed to minimize and survive possible secondary impacts between PWAs and surrounding structures because of the consequential amplification in acceleration and contact stress. This paper is the first of a two-part series and focuses on the drop test reliability of commercial off-the-shelf microelectromechanical systems (MEMS) components that are mounted on printed wiring boards (PWBs). Particularly in this paper, we are interested in gaining preliminary insights into the effects of secondary impacts (between internal structures) on failure sites in the MEMS assemblies. Drop tests are conducted under highly accelerated conditions of 20000 g (“g” is the gravitational acceleration). Under such high accelerations, the stress levels generated are well beyond those expected in conventional qualification tests. Furthermore, secondary impacts of varying intensities were allowed by changing the clearance between the PWB and the fixture. As a result, the stress and accelerations are further amplified, to mimic unexpected secondary impacts in a product if/when design rules fail to avoid such conditions. The amplification of the test severity is quantified by comparing the characteristic life (η in a Weibull distribution) of all the tested MEMS components at each clearance. Multiple failure sites from drop testing are identified, from packaging-level failures to MEMS device failures. The participation of competing failure sites is also demonstrated via characteristic life representations of each failure site at various clearances." @default.
• W2530902762 created "2016-10-21" @default.
• W2530902762 creator A5021463836 @default.
• W2530902762 creator A5057617043 @default.
• W2530902762 creator A5074203487 @default.
• W2530902762 date "2016-11-01" @default.
• W2530902762 modified "2023-09-24" @default.
• W2530902762 title "MEMS Packaging Reliability in Board-Level Drop Tests Under Severe Shock and Impact Loading Conditions–Part I: Experiment" @default.
• W2530902762 cites W1514079690 @default.
• W2530902762 cites W1572149291 @default.
• W2530902762 cites W1880827772 @default.
• W2530902762 cites W1882053628 @default.
• W2530902762 cites W1956824178 @default.
• W2530902762 cites W1996009094 @default.
• W2530902762 cites W2000257102 @default.
• W2530902762 cites W2011348917 @default.
• W2530902762 cites W2014209790 @default.
• W2530902762 cites W2015945229 @default.
• W2530902762 cites W2016352472 @default.
• W2530902762 cites W2051781659 @default.
• W2530902762 cites W2060762667 @default.
• W2530902762 cites W2065828888 @default.
• W2530902762 cites W2070642367 @default.
• W2530902762 cites W2077248976 @default.
• W2530902762 cites W2079598832 @default.
• W2530902762 cites W2087221057 @default.
• W2530902762 cites W2090633044 @default.
• W2530902762 cites W2091943280 @default.
• W2530902762 cites W2101569633 @default.
• W2530902762 cites W2110572418 @default.
• W2530902762 cites W2113036147 @default.
• W2530902762 cites W2113146379 @default.
• W2530902762 cites W2122468144 @default.
• W2530902762 cites W2123164153 @default.
• W2530902762 cites W2157040614 @default.
• W2530902762 cites W2158804487 @default.
• W2530902762 cites W2165136692 @default.
• W2530902762 cites W2171508187 @default.
• W2530902762 cites W2210209034 @default.
• W2530902762 cites W2289507581 @default.
• W2530902762 cites W2318603682 @default.
• W2530902762 cites W2467817400 @default.
• W2530902762 cites W4236827278 @default.
• W2530902762 cites W4240189896 @default.
• W2530902762 doi "https://doi.org/10.1109/tcpmt.2016.2611646" @default.
• W2530902762 hasPublicationYear "2016" @default.
• W2530902762 type Work @default.
• W2530902762 sameAs 2530902762 @default.
• W2530902762 citedByCount "25" @default.
• W2530902762 countsByYear W25309027622017 @default.
• W2530902762 countsByYear W25309027622018 @default.
• W2530902762 countsByYear W25309027622019 @default.
• W2530902762 countsByYear W25309027622020 @default.
• W2530902762 countsByYear W25309027622021 @default.
• W2530902762 countsByYear W25309027622022 @default.
• W2530902762 countsByYear W25309027622023 @default.
• W2530902762 crossrefType "journal-article" @default.
• W2530902762 hasAuthorship W2530902762A5021463836 @default.
• W2530902762 hasAuthorship W2530902762A5057617043 @default.
• W2530902762 hasAuthorship W2530902762A5074203487 @default.
• W2530902762 hasConcept C105795698 @default.
• W2530902762 hasConcept C119599485 @default.
• W2530902762 hasConcept C120793396 @default.
• W2530902762 hasConcept C121332964 @default.
• W2530902762 hasConcept C127413603 @default.
• W2530902762 hasConcept C1276947 @default.
• W2530902762 hasConcept C138885662 @default.
• W2530902762 hasConcept C14257148 @default.
• W2530902762 hasConcept C158379689 @default.
• W2530902762 hasConcept C163258240 @default.
• W2530902762 hasConcept C171146098 @default.
• W2530902762 hasConcept C173291955 @default.
• W2530902762 hasConcept C192562407 @default.
• W2530902762 hasConcept C199310239 @default.
• W2530902762 hasConcept C21036866 @default.
• W2530902762 hasConcept C2775865969 @default.
• W2530902762 hasConcept C2780483431 @default.
• W2530902762 hasConcept C2780644530 @default.
• W2530902762 hasConcept C2781122048 @default.
• W2530902762 hasConcept C2781345722 @default.
• W2530902762 hasConcept C33923547 @default.
• W2530902762 hasConcept C37977207 @default.
• W2530902762 hasConcept C41895202 @default.
• W2530902762 hasConcept C43214815 @default.
• W2530902762 hasConcept C49040817 @default.
• W2530902762 hasConcept C57528182 @default.
• W2530902762 hasConcept C62520636 @default.
• W2530902762 hasConcept C66938386 @default.
• W2530902762 hasConcept C69567186 @default.
• W2530902762 hasConcept C71976986 @default.
• W2530902762 hasConcept C78519656 @default.
• W2530902762 hasConceptScore W2530902762C105795698 @default.
• W2530902762 hasConceptScore W2530902762C119599485 @default.
• W2530902762 hasConceptScore W2530902762C120793396 @default.
• W2530902762 hasConceptScore W2530902762C121332964 @default.
• W2530902762 hasConceptScore W2530902762C127413603 @default.
• W2530902762 hasConceptScore W2530902762C1276947 @default.
• W2530902762 hasConceptScore W2530902762C138885662 @default.

• next