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- W253485366 abstract "Lead sulfide (PbS) thin films of different thicknesses ranging from 100 to 300 nm were prepared on glass substrates at 325℃ by chemical spray pyrolysis(CSP) technique. PbS thin films were prepared using a solution of Lead nitrate and thiourea. The structural properties were carried out by X-ray diffraction (XRD). X-ray diffraction patterns reveal that the films exhibit the cubic rock salt (NaCl) type structure. The crystalline grain sizes of the films increase with increasing film thickness. The root mean square (RMS) roughness of the films was measured using scanning tunneling microscope (STM). The root mean square roughness of the films increases as the film thickness increases. At room temperature, electrical resistivity and charge-carrier concentration of the PbS film varies from 53.72x10 3" @default.
- W253485366 created "2016-06-24" @default.
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- W253485366 date "2015-01-01" @default.
- W253485366 modified "2023-09-23" @default.
- W253485366 title "Effect of Thickness on the Structural and Electrical Properties of Spray Pyrolysed Lead Sulfide Thin Films" @default.
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