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- W2541508274 abstract "Hysteretic drain current (Id) drift phenomena observed in the high power operation of WSi gate GaAs MESFETs were studied. The existence of a thin insulating layer at WSi-GaAs interface originated by the native oxide on GaAs surface was revealed by XPS and X-ray reflection. Id drift phenomena can be explained as the effect of holes being trapped in the insulating layer at the WSi-GaAs Schottky contact interface." @default.
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- W2541508274 date "2002-11-19" @default.
- W2541508274 modified "2023-09-23" @default.
- W2541508274 title "Drain current drift by holes trapped in Schottky contact in WSi gate GaAs MESFETs" @default.
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- W2541508274 doi "https://doi.org/10.1109/gaas.1995.528967" @default.
- W2541508274 hasPublicationYear "2002" @default.
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