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- W2541594311 abstract "In order to design integrated circuits which can be manufactured with high yield the variations which can occur during manufacturing must be included with the compact models. The manufacturing variations comprise a complex correlated set of statistical distributions. This paper presents some of the current options and challenges in modeling variation. Improving the prediction of statistical circuit behavior will require coordinated improvement in models, netlisting tools and simulators." @default.
- W2541594311 created "2016-11-04" @default.
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- W2541594311 date "2007-12-01" @default.
- W2541594311 modified "2023-09-26" @default.
- W2541594311 title "Modeling circuit variability" @default.
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- W2541594311 doi "https://doi.org/10.1109/iwpsd.2007.4472454" @default.
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