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- W2541746718 abstract "Thermal phenomena are having an increasing influence on drive and leakage currents in modern transistors. This trend is accelerated for confined-geometry devices, which include thermally-resistive interfaces and materials with low thermal conductivity (e.g. SiO2, Si 1-xGex). This paper summarizes the nanotransistor thermal design challenges and reviews the latest advancements in electro-thermal modeling" @default.
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- W2541746718 date "2006-04-07" @default.
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- W2541746718 title "Thermal phenomena in deeply scaled MOSFETs" @default.
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- W2541746718 doi "https://doi.org/10.1109/iedm.2005.1609527" @default.
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