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- W2543395891 abstract "The feasibility of employing an I/sub DDQ/ output MOSFET amplifier in deep submicron CMOS ICs is evaluated. CUT performance is evaluated to determine the impact due to process scaling in the deep submicron regime. Comparisons of area overhead are made between BICS designs with and without the use of an output amplifier." @default.
- W2543395891 created "2016-11-04" @default.
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- W2543395891 date "2002-12-24" @default.
- W2543395891 modified "2023-09-24" @default.
- W2543395891 title "Feasibility of employing an I/sub DDQ/ output amplifier in deep submicron built-in current sensors" @default.
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- W2543395891 doi "https://doi.org/10.1109/iddq.1996.557822" @default.
- W2543395891 hasPublicationYear "2002" @default.
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