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- W2543582355 abstract "In this paper, a Design-for-Testability method is proposed to detect an open defect occurring at an interconnect between dies in a 3D IC. The open defect is detected by means of a supply current flowing whenever a time-varying voltage signal is provided to the targeted interconnect as a test input stimulus. Feasibility of the test method is examined by targeted experiments and circuit simulations. It is shown that an open defect in a testable designed IC is capable of being detected by measuring the supply current of the IC." @default.
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- W2543582355 date "2013-12-01" @default.
- W2543582355 modified "2023-09-25" @default.
- W2543582355 title "DFT for supply current testing to detect open defects at interconnects in 3D ICs" @default.
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- W2543582355 doi "https://doi.org/10.1109/edaps.2013.6724389" @default.
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