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- W2543888141 abstract "In CMOS technologies, hardness to ESD events is becoming a major reliability issue. In this context, NMOS transistors are particularly sensible. This study focus on the influence of LDD implantation on ESD failure threshold. ESD tests performed on elementary devices demonstrate the lower performance of LDD transistors. For NMOS transistors with and without LDD, electrothermal simulation have been performed, they lead to results similar to experimental ones, and give an explanation for greater heating in gradual junction." @default.
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- W2543888141 date "1995-09-01" @default.
- W2543888141 modified "2023-09-26" @default.
- W2543888141 title "Study of LDD Implantation Influence on ESD Failure Threshold using Electrothermal Simulation" @default.
- W2543888141 hasPublicationYear "1995" @default.
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