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- W2545545900 abstract "The author presents an overview of ion-implanted GaAs MESFET device fabrication, and the interconnect and process technologies developed for GaAs VLSI circuits. Circuit topologies and circuit results for GaAs VLSI are also presented. It is noted that the development and improvement of self-aligned refractory gate MESFET process technology, which produces high-quality enhancement and depletion transistors, allows the use of simple, high performance DCFL (direct coupled FET logic) circuit topology. This circuit family, coupled with advanced, high density, low capacitance interconnect technology provides the capability for very-high-performance, low-power GaAs VLSI circuits. Silicon MOS processing techniques and equipment have been used for fabrication of the circuits, and silicon-like circuit topologies, design tools, and design techniques have been used to design, verify, and test the circuits. Circuits of 100000 gate complexity are currently available. >" @default.
- W2545545900 created "2016-11-04" @default.
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- W2545545900 date "2002-12-09" @default.
- W2545545900 modified "2023-09-27" @default.
- W2545545900 title "GaAs digital VLSI device and circuit technology" @default.
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- W2545545900 doi "https://doi.org/10.1109/iedm.1991.235460" @default.
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