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• W2550458568 abstract "Resistive random access memory (RRAM) is one of the promising candidates for future universal memory. However, it suffers from serious error rate and endurance problems. Therefore, exploring a technical solution is greatly demanded to enhance endurance and reduce error rate. In this paper, we propose a reliable RRAM architecture that includes two reliability modules: error correction code (ECC) and self-repair modules. The ECC module is used to detect errors and decrease error rate. The self-repair module, which is proposed for the first time for RRAM, can get the information of error bits and repair wear-out cells by a repair voltage. Simulation results show that the proposed architecture can achieve lowest error rate and longest lifetime compared to previous reliable designs." @default.
• W2550458568 created "2016-11-30" @default.
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• W2550458568 date "2016-11-01" @default.
• W2550458568 modified "2023-09-27" @default.
• W2550458568 title "A long lifetime, low error rate RRAM design with self-repair module" @default.
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• W2550458568 doi "https://doi.org/10.1088/1674-4926/37/11/115004" @default.
• W2550458568 hasPublicationYear "2016" @default.
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