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- W2552495147 abstract "A new approach for parasitic effects cancellation is proposed, analyzed, and experimentally evaluated. The method exploits the symmetry of the proposed test structures. It greatly improves measurement sensitivity for small dielectric permittivity changes. The experimental results agree well with theoretical and simulation results." @default.
- W2552495147 created "2016-11-30" @default.
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- W2552495147 date "2008-06-01" @default.
- W2552495147 modified "2023-09-26" @default.
- W2552495147 title "On-chip cancellation of parasitic effects for dielectric permittivity measurement" @default.
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- W2552495147 doi "https://doi.org/10.1109/mwsym.2008.4633317" @default.
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