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- W2555528922 abstract "The methods of functional-logical simulation of digital integrated circuits (ICs) exposed to radiation are observed. It is shown that in a number of cases functional and electrical deterioration of ICs performances have both deterministic and non-deterministic nature. Methods for simulating IC failure exposed to radiation based on the model of fuzzy digital machine and Brauer probabilistic reliability machine are proposed." @default.
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- W2555528922 date "2016-10-01" @default.
- W2555528922 modified "2023-09-26" @default.
- W2555528922 title "Evaluation performance of digital integrated circuits while exposed to radiation" @default.
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- W2555528922 doi "https://doi.org/10.1088/1757-899x/151/1/012011" @default.
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