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- W2555877970 abstract "The testing problem in electronic circuit design does not include just DFT techniques on chip. In the laboratory environment it is also important to provide an efficient and inexpensive test set-up which does not require large industry testing equipment. This paper presents such a set-up and testing procedure for digital part of the mixed-signal ASIC dedicated for power-metering. The testing procedure consists of 2 levels: one during the normal operating mode and the second dedicated for particular testing of each arithmetic operator block. Control signals as well as the acquisition are performed through NI-DAQ PC-DIO-96 PnP card. All IC samples passed tests and are currently given for further industry implementation." @default.
- W2555877970 created "2016-11-30" @default.
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- W2555877970 date "2004-01-01" @default.
- W2555877970 modified "2023-09-24" @default.
- W2555877970 title "TESTING SET-UP FOR DIGITAL PART OF THE POWER- METER IC" @default.
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