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- W2556382988 abstract "The paper presents a simulation approach for characterization of integrated CMOS transistors to the needs of analog circuit design. To this aim the main design variables and the key performance indicators of the CMOS transistors are pointed out. A test-circuit for simulation and graphical representation of the relationships between the design variables and the performance indicators is described. It is based on the transfer function analysis mode of the LTspice simulator. The presented approach is examined by using transistors from 22nm bulk CMOS technology." @default.
- W2556382988 created "2016-11-30" @default.
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- W2556382988 date "2016-09-01" @default.
- W2556382988 modified "2023-09-27" @default.
- W2556382988 title "Characterization of CMOS transistors by using transfer function analysis" @default.
- W2556382988 cites W2119469825 @default.
- W2556382988 doi "https://doi.org/10.1109/et.2016.7753495" @default.
- W2556382988 hasPublicationYear "2016" @default.
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