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- W2560336467 abstract "Journal Article Utilization of FIB Technique in TEM Specimen Preparation of GaN-based Devices for Dislocation Investigation Get access Jian-Guo Zheng, Jian-Guo Zheng Irvine Materials Research Institute, University of California, Irvine, CA 92697-2800, USA Search for other works by this author on: Oxford Academic Google Scholar Zhenguang Shao, Zhenguang Shao Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials, and School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, P.R. China Search for other works by this author on: Oxford Academic Google Scholar Dunjun Chen Dunjun Chen Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials, and School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, P.R. China Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1991–1992, https://doi.org/10.1017/S1431927615010739 Published: 23 September 2015" @default.
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- W2560336467 date "2015-08-01" @default.
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- W2560336467 title "Utilization of FIB Technique in TEM Specimen Preparation of GaN-based Devices for Dislocation Investigation" @default.
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- W2560336467 doi "https://doi.org/10.1017/s1431927615010739" @default.
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