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- W2560734826 abstract "This data-set supports the article entitled The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology, accepted for the publication in Microelectronics Reliability DOI:10.1016/j.microrel.2016.10.018" @default.
- W2560734826 created "2016-12-16" @default.
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- W2560734826 date "2016-01-01" @default.
- W2560734826 modified "2023-09-24" @default.
- W2560734826 title "Data-set supporting the article entitled The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology" @default.
- W2560734826 doi "https://doi.org/10.5258/soton/403411" @default.
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