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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2562938488> ?p ?o ?g. }

• W2562938488 endingPage "390" @default.
• W2562938488 startingPage "384" @default.
• W2562938488 abstract "As more and more miniaturised devices are being developed, problems associated with their failures, and concerns of reliability are becoming more important. Failure modes and mechanisms of integrated circuits are related to either the extrinsic problems or device related or a combination of both. External effects such as that of overstress, electrostatic discharge and radiations are discussed along with the effect of hot carriers in the devices. Device related failure mechanisms include that of encapsulation, passivation, bonds, and of different process steps like diffusion, oxidation, metallization, etc of the semiconductor chip itself. This paper deals with a review of these failure modes and mechanisms by incorporating a detailed survey of the literature available." @default.
• W2562938488 created "2017-01-06" @default.
• W2562938488 creator A5022414010 @default.
• W2562938488 creator A5074634136 @default.
• W2562938488 creator A5081382128 @default.
• W2562938488 date "1990-09-01" @default.
• W2562938488 modified "2023-09-22" @default.
• W2562938488 title "Failure Mechanisms of Integrated Circuits—A Review" @default.
• W2562938488 cites W1975217117 @default.
• W2562938488 cites W1980984223 @default.
• W2562938488 cites W1990215011 @default.
• W2562938488 cites W1991159836 @default.
• W2562938488 cites W1995380250 @default.
• W2562938488 cites W2015464935 @default.
• W2562938488 cites W2018430479 @default.
• W2562938488 cites W2037276553 @default.
• W2562938488 cites W2053889244 @default.
• W2562938488 cites W2059779788 @default.
• W2562938488 cites W2066647049 @default.
• W2562938488 cites W2071310729 @default.
• W2562938488 cites W2085036024 @default.
• W2562938488 cites W2090010140 @default.
• W2562938488 cites W2096995644 @default.
• W2562938488 cites W2108583726 @default.
• W2562938488 cites W2108906545 @default.
• W2562938488 cites W2109736155 @default.
• W2562938488 cites W2121614704 @default.
• W2562938488 cites W2128750589 @default.
• W2562938488 cites W2136219341 @default.
• W2562938488 cites W2162692523 @default.
• W2562938488 cites W2478694005 @default.
• W2562938488 cites W4233227837 @default.
• W2562938488 doi "https://doi.org/10.1080/02564602.1990.11438677" @default.
• W2562938488 hasPublicationYear "1990" @default.
• W2562938488 type Work @default.
• W2562938488 sameAs 2562938488 @default.
• W2562938488 citedByCount "2" @default.
• W2562938488 crossrefType "journal-article" @default.
• W2562938488 hasAuthorship W2562938488A5022414010 @default.
• W2562938488 hasAuthorship W2562938488A5074634136 @default.
• W2562938488 hasAuthorship W2562938488A5081382128 @default.
• W2562938488 hasConcept C119599485 @default.
• W2562938488 hasConcept C121332964 @default.
• W2562938488 hasConcept C127413603 @default.
• W2562938488 hasConcept C134146338 @default.
• W2562938488 hasConcept C163258240 @default.
• W2562938488 hasConcept C165801399 @default.
• W2562938488 hasConcept C171250308 @default.
• W2562938488 hasConcept C192562407 @default.
• W2562938488 hasConcept C200601418 @default.
• W2562938488 hasConcept C205483674 @default.
• W2562938488 hasConcept C2779227376 @default.
• W2562938488 hasConcept C31258907 @default.
• W2562938488 hasConcept C33574316 @default.
• W2562938488 hasConcept C41008148 @default.
• W2562938488 hasConcept C43214815 @default.
• W2562938488 hasConcept C49040817 @default.
• W2562938488 hasConcept C530198007 @default.
• W2562938488 hasConcept C62520636 @default.
• W2562938488 hasConcept C79635011 @default.
• W2562938488 hasConcept C81147070 @default.
• W2562938488 hasConceptScore W2562938488C119599485 @default.
• W2562938488 hasConceptScore W2562938488C121332964 @default.
• W2562938488 hasConceptScore W2562938488C127413603 @default.
• W2562938488 hasConceptScore W2562938488C134146338 @default.
• W2562938488 hasConceptScore W2562938488C163258240 @default.
• W2562938488 hasConceptScore W2562938488C165801399 @default.
• W2562938488 hasConceptScore W2562938488C171250308 @default.
• W2562938488 hasConceptScore W2562938488C192562407 @default.
• W2562938488 hasConceptScore W2562938488C200601418 @default.
• W2562938488 hasConceptScore W2562938488C205483674 @default.
• W2562938488 hasConceptScore W2562938488C2779227376 @default.
• W2562938488 hasConceptScore W2562938488C31258907 @default.
• W2562938488 hasConceptScore W2562938488C33574316 @default.
• W2562938488 hasConceptScore W2562938488C41008148 @default.
• W2562938488 hasConceptScore W2562938488C43214815 @default.
• W2562938488 hasConceptScore W2562938488C49040817 @default.
• W2562938488 hasConceptScore W2562938488C530198007 @default.
• W2562938488 hasConceptScore W2562938488C62520636 @default.
• W2562938488 hasConceptScore W2562938488C79635011 @default.
• W2562938488 hasConceptScore W2562938488C81147070 @default.
• W2562938488 hasIssue "5-6" @default.
• W2562938488 hasLocation W25629384881 @default.
• W2562938488 hasOpenAccess W2562938488 @default.
• W2562938488 hasPrimaryLocation W25629384881 @default.
• W2562938488 hasRelatedWork W1521868158 @default.
• W2562938488 hasRelatedWork W1976621533 @default.
• W2562938488 hasRelatedWork W1984545548 @default.
• W2562938488 hasRelatedWork W1988801985 @default.
• W2562938488 hasRelatedWork W2072857951 @default.
• W2562938488 hasRelatedWork W2151971305 @default.
• W2562938488 hasRelatedWork W2189530789 @default.
• W2562938488 hasRelatedWork W4251023552 @default.
• W2562938488 hasRelatedWork W4251192495 @default.
• W2562938488 hasRelatedWork W2150729222 @default.
• W2562938488 hasVolume "7" @default.
• W2562938488 isParatext "false" @default.
• W2562938488 isRetracted "false" @default.

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