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- W2565002425 abstract "For materials science research a good understanding of the connection between the nanostructure of the material and its unique properties is important. Recent improvements in the performance and capabilities of STEM and TEM systems have increased the quality of the images and analytical data obtained and provided some exciting new capabilities, making S/TEM an even more indispensable tool for characterizing nanostructures. However, studies under normal microscope conditions (room temperature and high vacuum) are not always suitable or sufficient. Advances in in-situ TEM imaging technology have expanded the conditions under which TEM can be used, and it is now practical to perform atomic-resolution imaging of materials in gas environments and at high temperature, as well as applying force or flowing current during S/TEM imaging. The use of differential pumping apertures in an aberration corrected TEM (FEI Titan ETEM) enables in-gas studies of oxidation, reduction and corrosion [ 1 ]. Further developments in in situ heating stages to reduce settling time and provide more accurate knowledge of experimental conditions have enabled atomic-scale studies at high temperature in a gas environment. FEI's new NanoEx™ MEMS-based heating holder [ 2 ] gives fine temperature control using a four-probe resistance measurement. Additional electrical contacts allow sample biasing. fEi's NanoEx i/v is also compatible with EDX [ 3 ], for compositional studies under the influence of thermal and electrical stimuli." @default.
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- W2565002425 date "2015-11-01" @default.
- W2565002425 modified "2023-09-25" @default.
- W2565002425 title "B12-O-04Controlling experimental conditions in advancedin-situS/TEM experiments" @default.
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- W2565002425 doi "https://doi.org/10.1093/jmicro/dfv091" @default.
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