Matches in SemOpenAlex for { <https://semopenalex.org/work/W2565209232> ?p ?o ?g. }
Showing items 1 to 97 of
97
with 100 items per page.
- W2565209232 abstract "We have adapted recently developed techniques for fast-pulsed I-V characterization, to monitor the changes of various trap populations during lifetests of GaN high electron mobility transistors (HEMTs). Unlike other techniques, this approach is rapid and well-suited to repeated characterizations of multiple devices during a lifetest. We monitor qualitatively, the populations of “shallow” traps (those we can change with moderate “pre-treatments”) under the gates, as well as between the gate and drain contacts, and distinguish “slow” and “fast” traps (with time constants greater or less than 10 minutes). Also, we monitor changes in the populations of “deep” traps. Examples are shown from DC and RF lifetests on GaN HEMT devices from one foundry. As-fabricated, these FETs have fast traps under the gate and slow and fast traps in the G-D access region. With lifetest stress (DC or RF), approximately $1times 10^{12}$ more fast traps per cm $^{2}$ develop in the G-D access region, and about $2times 10^{12}$ deep traps per cm $^{2}$ develop under the gates, while the other trap populations are not changed." @default.
- W2565209232 created "2017-01-06" @default.
- W2565209232 creator A5043844308 @default.
- W2565209232 creator A5045446264 @default.
- W2565209232 creator A5059935639 @default.
- W2565209232 creator A5060747021 @default.
- W2565209232 creator A5063155110 @default.
- W2565209232 date "2017-03-01" @default.
- W2565209232 modified "2023-09-27" @default.
- W2565209232 title "Fast-Pulsed Characterizations of RF GaN HEMTs During Wearout" @default.
- W2565209232 cites W1532396321 @default.
- W2565209232 cites W2016869862 @default.
- W2565209232 cites W2018455271 @default.
- W2565209232 cites W2031164960 @default.
- W2565209232 cites W2031625458 @default.
- W2565209232 cites W2103067995 @default.
- W2565209232 cites W2122464392 @default.
- W2565209232 cites W2123665191 @default.
- W2565209232 cites W2124985289 @default.
- W2565209232 cites W2141966815 @default.
- W2565209232 cites W2157958892 @default.
- W2565209232 cites W2163093036 @default.
- W2565209232 cites W2163194368 @default.
- W2565209232 cites W2181911685 @default.
- W2565209232 cites W2224179476 @default.
- W2565209232 cites W2521196397 @default.
- W2565209232 cites W2551893598 @default.
- W2565209232 doi "https://doi.org/10.1109/tdmr.2016.2638849" @default.
- W2565209232 hasPublicationYear "2017" @default.
- W2565209232 type Work @default.
- W2565209232 sameAs 2565209232 @default.
- W2565209232 citedByCount "1" @default.
- W2565209232 countsByYear W25652092322018 @default.
- W2565209232 crossrefType "journal-article" @default.
- W2565209232 hasAuthorship W2565209232A5043844308 @default.
- W2565209232 hasAuthorship W2565209232A5045446264 @default.
- W2565209232 hasAuthorship W2565209232A5059935639 @default.
- W2565209232 hasAuthorship W2565209232A5060747021 @default.
- W2565209232 hasAuthorship W2565209232A5063155110 @default.
- W2565209232 hasConcept C119599485 @default.
- W2565209232 hasConcept C121099081 @default.
- W2565209232 hasConcept C121332964 @default.
- W2565209232 hasConcept C127413603 @default.
- W2565209232 hasConcept C131017901 @default.
- W2565209232 hasConcept C153294291 @default.
- W2565209232 hasConcept C162057924 @default.
- W2565209232 hasConcept C165801399 @default.
- W2565209232 hasConcept C171250308 @default.
- W2565209232 hasConcept C172385210 @default.
- W2565209232 hasConcept C192562407 @default.
- W2565209232 hasConcept C2778871202 @default.
- W2565209232 hasConcept C2779227376 @default.
- W2565209232 hasConcept C2780841128 @default.
- W2565209232 hasConcept C49040817 @default.
- W2565209232 hasConceptScore W2565209232C119599485 @default.
- W2565209232 hasConceptScore W2565209232C121099081 @default.
- W2565209232 hasConceptScore W2565209232C121332964 @default.
- W2565209232 hasConceptScore W2565209232C127413603 @default.
- W2565209232 hasConceptScore W2565209232C131017901 @default.
- W2565209232 hasConceptScore W2565209232C153294291 @default.
- W2565209232 hasConceptScore W2565209232C162057924 @default.
- W2565209232 hasConceptScore W2565209232C165801399 @default.
- W2565209232 hasConceptScore W2565209232C171250308 @default.
- W2565209232 hasConceptScore W2565209232C172385210 @default.
- W2565209232 hasConceptScore W2565209232C192562407 @default.
- W2565209232 hasConceptScore W2565209232C2778871202 @default.
- W2565209232 hasConceptScore W2565209232C2779227376 @default.
- W2565209232 hasConceptScore W2565209232C2780841128 @default.
- W2565209232 hasConceptScore W2565209232C49040817 @default.
- W2565209232 hasFunder F4320338294 @default.
- W2565209232 hasLocation W25652092321 @default.
- W2565209232 hasOpenAccess W2565209232 @default.
- W2565209232 hasPrimaryLocation W25652092321 @default.
- W2565209232 hasRelatedWork W1532689450 @default.
- W2565209232 hasRelatedWork W1967205563 @default.
- W2565209232 hasRelatedWork W1972815456 @default.
- W2565209232 hasRelatedWork W1973980126 @default.
- W2565209232 hasRelatedWork W1984193561 @default.
- W2565209232 hasRelatedWork W1986222103 @default.
- W2565209232 hasRelatedWork W2008296397 @default.
- W2565209232 hasRelatedWork W2030264661 @default.
- W2565209232 hasRelatedWork W2034949991 @default.
- W2565209232 hasRelatedWork W2052067342 @default.
- W2565209232 hasRelatedWork W2102475776 @default.
- W2565209232 hasRelatedWork W2124503040 @default.
- W2565209232 hasRelatedWork W2157881707 @default.
- W2565209232 hasRelatedWork W2157958892 @default.
- W2565209232 hasRelatedWork W2215129576 @default.
- W2565209232 hasRelatedWork W2387001772 @default.
- W2565209232 hasRelatedWork W2475544643 @default.
- W2565209232 hasRelatedWork W2588390574 @default.
- W2565209232 hasRelatedWork W2589592487 @default.
- W2565209232 hasRelatedWork W3139213535 @default.
- W2565209232 isParatext "false" @default.
- W2565209232 isRetracted "false" @default.
- W2565209232 magId "2565209232" @default.
- W2565209232 workType "article" @default.