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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2566048981> ?p ?o ?g. }

• W2566048981 endingPage "701" @default.
• W2566048981 startingPage "700" @default.
• W2566048981 abstract "Zeolites are an important group of materials with a wide range of application in the catalysis industry. Many structural studies of zeolites rely on high resolution electron microscope imaging [1]. However, due to their high sensitivity to electron irradiation, zeolites deteriorate quickly under exposure to the electron beam. Low‐dose imaging techniques use a reduced electron flux to slow the crystal degradation process, which gives more time for adjustment of the microscope configuration and better control over the progression of damage. However the disadvantage of low‐dose imaging is poor signal to noise ratio which is often alleviated by averaging multiple image frames in a time series for improved image quality. Traditional rigid cross‐correlation function (XCF) image registration methods work well for aligning high‐dose time series of radiation‐robust materials which experience little or no deformation during image acquisition. However, the deformation in radiation‐sensitive materials, often manifest by sample shrinkage, means that the single translational shift vector from rigid image registration may not be sufficient for aligning time series and hence a non‐rigid registration scheme is needed. In this work, a low‐dose time series of ZSM‐5 zeolite consisting 60 image frames were recorded using an aberration‐corrected JEOL2200MCO TEM (Figure 1). Two registration methods, a rigid XCF registration and a new non‐rigid registration, were used to align the series respectively. The non‐rigid registration method [2] is assisted by an IQ factor criterion, which evaluates the quality of the averaged image of the series as the registration proceeds and selects the best averaged image as the reference for future registration iterations. The results show that the new non‐rigid registration is helpful for alignment of low‐dose TEM image series of radiation‐sensitive materials that experience deformation during imaging, especially when the number of frames is small and when the sample is already damaged (Figure 2). This implies that, for TEM image series, the non‐rigid registration approach is more effective in noise suppression and in avoiding the image components of a damaged sample compromising the final averaged image. For further comparison, a low‐dose STEM time series of zeolite Y, was registered by both rigid and non‐rigid methods. A comparative analysis of IQ factor was carried out on the averaged images and showed that the non‐rigid registration consistently outperforms the rigid XCF registration (Figure 3). The reason for this advantage is attributed to the fact that the STEM images often suffer from additional scan noise due to the pixel‐by‐pixel acquisition in STEM imaging." @default.
• W2566048981 created "2017-01-06" @default.
• W2566048981 creator A5006553673 @default.
• W2566048981 creator A5012384563 @default.
• W2566048981 creator A5078036358 @default.
• W2566048981 date "2016-12-20" @default.
• W2566048981 modified "2023-10-17" @default.
• W2566048981 title "Non-rigid image registration of low-dose image series of zeolite materials" @default.
• W2566048981 cites W1982390477 @default.
• W2566048981 cites W2015969595 @default.
• W2566048981 doi "https://doi.org/10.1002/9783527808465.emc2016.6743" @default.
• W2566048981 hasPublicationYear "2016" @default.
• W2566048981 type Work @default.
• W2566048981 sameAs 2566048981 @default.
• W2566048981 citedByCount "0" @default.
• W2566048981 crossrefType "other" @default.
• W2566048981 hasAuthorship W2566048981A5006553673 @default.
• W2566048981 hasAuthorship W2566048981A5012384563 @default.
• W2566048981 hasAuthorship W2566048981A5078036358 @default.
• W2566048981 hasBestOaLocation W25660489811 @default.
• W2566048981 hasConcept C115961682 @default.
• W2566048981 hasConcept C120665830 @default.
• W2566048981 hasConcept C121332964 @default.
• W2566048981 hasConcept C154945302 @default.
• W2566048981 hasConcept C166704113 @default.
• W2566048981 hasConcept C192562407 @default.
• W2566048981 hasConcept C205372480 @default.
• W2566048981 hasConcept C31972630 @default.
• W2566048981 hasConcept C41008148 @default.
• W2566048981 hasConcept C55020928 @default.
• W2566048981 hasConceptScore W2566048981C115961682 @default.
• W2566048981 hasConceptScore W2566048981C120665830 @default.
• W2566048981 hasConceptScore W2566048981C121332964 @default.
• W2566048981 hasConceptScore W2566048981C154945302 @default.
• W2566048981 hasConceptScore W2566048981C166704113 @default.
• W2566048981 hasConceptScore W2566048981C192562407 @default.
• W2566048981 hasConceptScore W2566048981C205372480 @default.
• W2566048981 hasConceptScore W2566048981C31972630 @default.
• W2566048981 hasConceptScore W2566048981C41008148 @default.
• W2566048981 hasConceptScore W2566048981C55020928 @default.
• W2566048981 hasLocation W25660489811 @default.
• W2566048981 hasOpenAccess W2566048981 @default.
• W2566048981 hasPrimaryLocation W25660489811 @default.
• W2566048981 hasRelatedWork W2009466720 @default.
• W2566048981 hasRelatedWork W2011443206 @default.
• W2566048981 hasRelatedWork W2041698670 @default.
• W2566048981 hasRelatedWork W2103390397 @default.
• W2566048981 hasRelatedWork W2114100766 @default.
• W2566048981 hasRelatedWork W2125070361 @default.
• W2566048981 hasRelatedWork W2154555259 @default.
• W2566048981 hasRelatedWork W2167923216 @default.
• W2566048981 hasRelatedWork W2203553948 @default.
• W2566048981 hasRelatedWork W3163375306 @default.
• W2566048981 isParatext "false" @default.
• W2566048981 isRetracted "false" @default.
• W2566048981 magId "2566048981" @default.
• W2566048981 workType "other" @default.