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- W2567969579 abstract "Abstract In this study we present a new in situ real-time approach to perform and analyze scratch tests of transparent coating/substrates systems. This method allows for the observation of the contact region during the scratching process. As an example, thin TiO 2 layers exhibiting stress levels ranging from tensile to compressive were deposited by ion beam assisted evaporation onto plastic substrates. Failure processes obtained using an increasing and a novel decreasing load scratch sequences were then linked to the internal stress in the coatings allowing one to draw a stress management diagram and to evaluate the yield stress of the TiO 2 layers. This work enhances the understanding of the optical films’ failure mechanisms, and outlines a new pathway to increase measurement reproducibility." @default.
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- W2567969579 date "2017-05-01" @default.
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- W2567969579 title "Influence of internal stress in optical thin films on their failure modes assessed by in situ real-time scratch analysis" @default.
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- W2567969579 doi "https://doi.org/10.1016/j.triboint.2016.12.053" @default.
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