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• W2569900176 abstract "Molecular dynamics (MD) simulation was used to study of thermal properties of NiTi/Cu. Embedded atom method (EAM) potentials for describing of inter-atomic interaction and Nose–Hoover thermostat and barostat are employed. The melting of the bi-layers was considered by studying the temperature dependence of the cohesive energy and mean square displacement. To highlight the differences between bi-layers with various copper layer thickness, the effect of copper film thickness on thermal properties containing the cohesive energy, melting point, isobaric heat capacity and latent heat of fusion was estimated. The results show that thermal properties of bi-layer systems are higher than that of their corresponding of pure NiTi. But, these properties of bi-layer systems approximately are independent of copper film thicknesses. The mean square displacement (MSD) results show that, the diffusion coefficients enhance upon increasing of copper film thickness in a linear performance." @default.
• W2569900176 created "2017-01-13" @default.
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• W2569900176 date "2017-02-01" @default.
• W2569900176 modified "2023-09-27" @default.
• W2569900176 title "What is the copper thin film thickness effect on thermal properties of NiTi/Cu bi-layer?" @default.
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• W2569900176 doi "https://doi.org/10.1088/2053-1591/aa576e" @default.
• W2569900176 hasPublicationYear "2017" @default.
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