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• W2571057918 abstract "Modern VLSI designs experience significant temperature change due to variations in workload and ambient conditions. The change in temperature can cause variation in other performance parameters such as power and reliability. Modern chips use complex self-calibration techniques to adjust design parameters to safeguard the chip's operation against temperature fluctuations. Any on-chip self-calibration system needs a temperature variation detecting to observe the temperature of the chip at the spot of interest. This paper describes a novel approach of on chip temperature variation detecting in submicron CMOS technology for a wide range of temperature variation." @default.
• W2571057918 created "2017-01-13" @default.
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• W2571057918 date "2016-10-01" @default.
• W2571057918 modified "2023-09-25" @default.
• W2571057918 title "A novel approach to detect temperature variation" @default.
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• W2571057918 doi "https://doi.org/10.1109/ewdts.2016.7807715" @default.
• W2571057918 hasPublicationYear "2016" @default.
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