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- W2580016242 abstract "We determine the instrument response of an ultrafast electron microscope equipped with a conventional thermionic electron gun and absent modifications beyond the optical ports. Using flat, graphite-encircled LaB6 cathodes, we image space-charge effects as a function of photoelectron-packet population and find that an applied Wehnelt bias has a negligible effect on the threshold levels (>103 electrons per pulse) but does appear to suppress blurring at the upper limits (∼105 electrons). Using plasma lensing, we determine the instrument-response time for 700-fs laser pulses and find that single-electron packets are laser limited (1 ps), while broadening occurs well below the space-charge limit." @default.
- W2580016242 created "2017-02-03" @default.
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- W2580016242 date "2017-09-01" @default.
- W2580016242 modified "2023-10-16" @default.
- W2580016242 title "Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes" @default.
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- W2580016242 doi "https://doi.org/10.1016/j.cplett.2017.01.055" @default.
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