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- W2582220472 abstract "Molybdenum disulphide (MoS 2 ) is currently regarded as a promising material for the next generation of electronic and optoelectronic devices. However, several issues need to be addressed to fully exploit its potential for field effect transistor (FET) applications. In this context, the contact resistance, R C , associated with the Schottky barrier between source/drain metals and MoS 2 currently represents one of the main limiting factors for suitable device performance. Furthermore, to gain a deeper understanding of MoS 2 FETs under practical operating conditions, it is necessary to investigate the temperature dependence of the main electrical parameters, such as the field effect mobility (μ) and the threshold voltage ( V th ). This paper reports a detailed electrical characterization of back-gated multilayer MoS 2 transistors with Ni source/drain contacts at temperatures from T = 298 to 373 K, i.e., the expected range for transistor operation in circuits/systems, considering heating effects due to inefficient power dissipation. From the analysis of the transfer characteristics ( I D − V G ) in the subthreshold regime, the Schottky barrier height (Φ B ≈ 0.18 eV) associated with the Ni/MoS 2 contact was evaluated. The resulting contact resistance in the on-state (electron accumulation in the channel) was also determined and it was found to increase with T as R C proportional to T 3.1 . The contribution of R C to the extraction of μ and V th was evaluated, showing a more than 10% underestimation of μ when the effect of R C is neglected, whereas the effect on V th is less significant. The temperature dependence of μ and V th was also investigated. A decrease of μ proportional to 1/ T α with α = 1.4 ± 0.3 was found, indicating scattering by optical phonons as the main limiting mechanism for mobility above room temperature. The value of V th showed a large negative shift (about 6 V) increasing the temperature from 298 to 373 K, which was explained in terms of electron trapping at MoS 2 /SiO 2 interface states." @default.
- W2582220472 created "2017-02-03" @default.
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- W2582220472 date "2017-01-25" @default.
- W2582220472 modified "2023-10-16" @default.
- W2582220472 title "Impact of contact resistance on the electrical properties of MoS<sub>2</sub> transistors at practical operating temperatures" @default.
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- W2582220472 doi "https://doi.org/10.3762/bjnano.8.28" @default.
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