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- W2599724166 abstract "From the microscopic point of view, the elemental processes of crystal deformation are the motion and the multiplication of disloca–tions. To study these processes, which are essentially dynamical, a new direct method has been developed by using a high voltage electron microscope (HVEM) in combination with an image intensifer and a video tape recorder (VTR). There the records of the stress and strain being applied to the specimen and also the images of moving dislocations have been made in parallel with straining a foil specimen in HVEM. Withe the aid of this method, it is found that the mobilities of edge dislocations in Fe–3% Si and pure Fe are several times larger than those of screw dislocations and that the velocity of moving screw dislocations in Fe-3% Si, for instance, is about 6X 10−4 cm/sec under the resolved shear stress of 7.5 kg/mm2. The multiplications of dislocations at a single-ended source and also mobile superjogs are newly observed. In these cases, the multiplication rate is controlled by the slow rate of revolution and motion of the screw component. The dynamical cell formation as well as the generation of dislocations near the tip of propagating crack and the associated phenomena are directly observed with the method too. The character of frictional forces which control principally the dynamical behaviors of dislocations in various types of crystals is now being investigated from such a way of approach as mentioned above." @default.
- W2599724166 created "2017-04-07" @default.
- W2599724166 date "1970-01-01" @default.
- W2599724166 modified "2023-10-17" @default.
- W2599724166 title "a study of Dynamical Properties of Dislocations by means of A High Voltage Electron Microscope with Image Intensifier" @default.
- W2599724166 doi "https://doi.org/10.1093/oxfordjournals.jmicro.a049709" @default.
- W2599724166 hasPublicationYear "1970" @default.
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