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- W2602455693 abstract "HIERARCHICAL CHARACTERIZATION OF DEFORMATION HETEROGENEITIES IN BCC CRYSTALS Karen R. Magid * , Erica T. Lilleodden + , Nobumichi Tamura ** , Jeff Florando ++ , Dave Lassila ++ , Rozaliya I. Barabash *** , and J. W. Morris *,+++ Department of Materials Science & Engineering, University of California- Berkeley, Berkeley, CA 94720, kmagid@berkeley.edu Institut fur Materialforschung II, Forschungszentrum Karlsruhe, D-76021 Karlsruhe, Germany, Erica.Lilleodden@imf.fzk.de Advanced Light Source, Lawrence Berkeley National Lab, 1 Cyclotron Rd., Berkeley, CA 94720, ntamura@lbl.gov Engineering Directorate, Lawrence Livermore National Lab, 7000 East Avenue, Livermore, CA 94550, florando1@llnl.gov Division of Metals & Ceramics, Oak Ridge National Laboratory, Oak Ridge, TN 37831, barabashr@ornl.gov Materials Science Division, Lawrence Berkeley National Lab, 1 Cyclotron Rd., Berkeley, CA 94720, jwmorris@berkeley.edu ABSTRACT- Deformation behavior of body-centered cubic (BCC) metals is being investigated by white beam x-ray microdiffraction to characterize the dislocation structure that results from uniaxial compression experiments. The measurements were performed on molybdenum single crystals and a tantalum bicrystal as part of a hierarchical characterization effort. Results show heterogeneities in the deformed structure and misorientation maps consistent with results obtained from Orientation Imaging Microscopy (OIM). Additionally, the technique allows for the determination of the active glide systems as well as of the dislocation densities in function of the position in the sample. INTRODUCTION: BCC materials are of scientific interest because of the anomalous deformation behavior noted in the literature for the past 40 years (Christian [1983]). In order to fully understand it, we have used the emerging technique of Synchrotron white beam X- ray microdiffraction to map heterogeneities, residual stress and local distortion in molybdenum single crystals and a tantalum bicrystal oriented for single slip and loaded in compression. White beam microdiffraction serves a critical role within the hierarchy of such detailed characterization; stand-alone TEM characterization is too inefficient to be useful, and optical and atomic force microscopies cannot relay information on the internal strain state. The advantage of this technique over TEM is the ability to probe over large areas (100 microns), and still have the spatial resolution (1 micron) to distinguish changes in the local dislocation structure. The heterogeneity of the plastic deformation is apparent in the" @default.
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- W2602455693 date "2005-01-01" @default.
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- W2602455693 title "Hierarchical Characterization of Deformation Heterogeneities in BCC crystals - eScholarship" @default.
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