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- W2608811700 abstract "Non-volatile memory area occupies a large portion of the area of a chip in an embedded system. Such memories are prone to manufacturing faults, retention faults, and aging faults. The paper presents a single software based technique that allows for handling all of these fault types in tiny embedded systems without the need for hardware support. This is beneficial for low-cost embedded systems with simple memory architectures. A software infrastructure and a flow are presented that demonstrate how the presented technique is used in general for fault handling right after manufacturing and in-the-field. Moreover, a full implementation is presented for a MSP430 microcontroller, along with a discussion of the performance, overhead, and reliability impacts." @default.
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- W2608811700 date "2017-03-01" @default.
- W2608811700 modified "2023-09-24" @default.
- W2608811700 title "Handling manufacturing and aging faults with software-based techniques in tiny embedded systems" @default.
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- W2608811700 doi "https://doi.org/10.1109/latw.2017.7906756" @default.
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