Matches in SemOpenAlex for { <https://semopenalex.org/work/W2614931415> ?p ?o ?g. }
- W2614931415 abstract "The Threshold voltage variability is increasing due to the process variability and reliability issues. SRAM cell stability dependence with threshold voltage is analyzed in order to extract reliability degradation due to BTI-induced V th drift. The several write margin definitions are selected and their feasibility to be implemented in a threshold voltage built-in sensor is analyzed. The writability margins based on external cell nodes measurement have demonstrated best suitability for large memory arrays reducing the needs of hardware maintaining a good linearity for both high activity systems and long time storage." @default.
- W2614931415 created "2017-05-26" @default.
- W2614931415 creator A5021213940 @default.
- W2614931415 creator A5027850952 @default.
- W2614931415 date "2017-04-01" @default.
- W2614931415 modified "2023-09-30" @default.
- W2614931415 title "Evaluation of SRAM cell write margin metrics for lifetime monitoring of BTI-induced Vth drift" @default.
- W2614931415 cites W1503396677 @default.
- W2614931415 cites W1600856165 @default.
- W2614931415 cites W1996188635 @default.
- W2614931415 cites W2009080282 @default.
- W2614931415 cites W2073720969 @default.
- W2614931415 cites W2090481579 @default.
- W2614931415 cites W2102655721 @default.
- W2614931415 cites W2113488294 @default.
- W2614931415 cites W2117043376 @default.
- W2614931415 cites W2125347149 @default.
- W2614931415 cites W2138577377 @default.
- W2614931415 cites W2139423216 @default.
- W2614931415 cites W2155153274 @default.
- W2614931415 cites W2159087234 @default.
- W2614931415 cites W2162583644 @default.
- W2614931415 cites W2162613878 @default.
- W2614931415 cites W2171922263 @default.
- W2614931415 cites W2172173999 @default.
- W2614931415 cites W2327678638 @default.
- W2614931415 cites W2345094463 @default.
- W2614931415 cites W2394816330 @default.
- W2614931415 cites W2507925346 @default.
- W2614931415 cites W2537767489 @default.
- W2614931415 doi "https://doi.org/10.1109/dtis.2017.7930175" @default.
- W2614931415 hasPublicationYear "2017" @default.
- W2614931415 type Work @default.
- W2614931415 sameAs 2614931415 @default.
- W2614931415 citedByCount "1" @default.
- W2614931415 countsByYear W26149314152017 @default.
- W2614931415 crossrefType "proceedings-article" @default.
- W2614931415 hasAuthorship W2614931415A5021213940 @default.
- W2614931415 hasAuthorship W2614931415A5027850952 @default.
- W2614931415 hasConcept C111919701 @default.
- W2614931415 hasConcept C119599485 @default.
- W2614931415 hasConcept C119857082 @default.
- W2614931415 hasConcept C121332964 @default.
- W2614931415 hasConcept C127413603 @default.
- W2614931415 hasConcept C163258240 @default.
- W2614931415 hasConcept C165801399 @default.
- W2614931415 hasConcept C172385210 @default.
- W2614931415 hasConcept C192562407 @default.
- W2614931415 hasConcept C195370968 @default.
- W2614931415 hasConcept C200601418 @default.
- W2614931415 hasConcept C24326235 @default.
- W2614931415 hasConcept C2779679103 @default.
- W2614931415 hasConcept C41008148 @default.
- W2614931415 hasConcept C43214815 @default.
- W2614931415 hasConcept C557185 @default.
- W2614931415 hasConcept C62520636 @default.
- W2614931415 hasConcept C68043766 @default.
- W2614931415 hasConcept C77170095 @default.
- W2614931415 hasConcept C774472 @default.
- W2614931415 hasConcept C98045186 @default.
- W2614931415 hasConceptScore W2614931415C111919701 @default.
- W2614931415 hasConceptScore W2614931415C119599485 @default.
- W2614931415 hasConceptScore W2614931415C119857082 @default.
- W2614931415 hasConceptScore W2614931415C121332964 @default.
- W2614931415 hasConceptScore W2614931415C127413603 @default.
- W2614931415 hasConceptScore W2614931415C163258240 @default.
- W2614931415 hasConceptScore W2614931415C165801399 @default.
- W2614931415 hasConceptScore W2614931415C172385210 @default.
- W2614931415 hasConceptScore W2614931415C192562407 @default.
- W2614931415 hasConceptScore W2614931415C195370968 @default.
- W2614931415 hasConceptScore W2614931415C200601418 @default.
- W2614931415 hasConceptScore W2614931415C24326235 @default.
- W2614931415 hasConceptScore W2614931415C2779679103 @default.
- W2614931415 hasConceptScore W2614931415C41008148 @default.
- W2614931415 hasConceptScore W2614931415C43214815 @default.
- W2614931415 hasConceptScore W2614931415C557185 @default.
- W2614931415 hasConceptScore W2614931415C62520636 @default.
- W2614931415 hasConceptScore W2614931415C68043766 @default.
- W2614931415 hasConceptScore W2614931415C77170095 @default.
- W2614931415 hasConceptScore W2614931415C774472 @default.
- W2614931415 hasConceptScore W2614931415C98045186 @default.
- W2614931415 hasLocation W26149314151 @default.
- W2614931415 hasOpenAccess W2614931415 @default.
- W2614931415 hasPrimaryLocation W26149314151 @default.
- W2614931415 hasRelatedWork W1558320928 @default.
- W2614931415 hasRelatedWork W2020121195 @default.
- W2614931415 hasRelatedWork W2025675739 @default.
- W2614931415 hasRelatedWork W2037737201 @default.
- W2614931415 hasRelatedWork W2050605642 @default.
- W2614931415 hasRelatedWork W2102209270 @default.
- W2614931415 hasRelatedWork W2123278390 @default.
- W2614931415 hasRelatedWork W2124748568 @default.
- W2614931415 hasRelatedWork W2134803912 @default.
- W2614931415 hasRelatedWork W2511613899 @default.
- W2614931415 hasRelatedWork W2534354351 @default.
- W2614931415 hasRelatedWork W2586335893 @default.
- W2614931415 hasRelatedWork W2750392872 @default.
- W2614931415 hasRelatedWork W2756730614 @default.
- W2614931415 hasRelatedWork W2804691385 @default.
- W2614931415 hasRelatedWork W2901551528 @default.