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• W2619009809 abstract "This chapter first briefly outlines preparation techniques for making electron-transparent samples from various materials. Then, the basic components of transmission electron microscopes are described. After this, the operation modes for diffraction, imaging, and spectroscopy with fast electrons are explained, providing the reader with information on what techniques are available for what purposes. Finally, an overview of applications of transmission electron microscopy (TEM) for studying nanostructures is given, with emphasis on defect, thin layer, nanowire, and nanoparticle size measurements in practice, which informs the reader to choose the most appropriate TEM-based technique for a given problem." @default.
• W2619009809 created "2017-06-05" @default.
• W2619009809 creator A5013609909 @default.
• W2619009809 date "2017-01-01" @default.
• W2619009809 modified "2023-09-26" @default.
• W2619009809 title "Transmission Electron Microscopy of Nanostructures" @default.
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• W2619009809 doi "https://doi.org/10.1016/b978-0-323-46141-2.00004-3" @default.
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