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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2621396681> ?p ?o ?g. }

• W2621396681 endingPage "3398" @default.
• W2621396681 startingPage "3386" @default.
• W2621396681 abstract "GaN power switches provide remarkable performance in terms of power-density, reduced parasitics, and high-thermal handling capability that enable the realization of very efficient and compact dc/dc converters. Despite exhibiting state-of-the-art channel conductivity, GaN high electron mobility transistor (HEMT) devices are affected by the degradation of the dynamic ON-Resistance (R <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>ON</sub> ) at increasing OFF-state voltages and operative temperatures. In this paper, a novel laboratory setup and characterization procedure for the dynamic R <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>ON</sub> of GaN HEMT switches in the presence of thermal- and trapping-effects is presented. The proposed setup allows the study of R <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>ON</sub> transients after the switching event at variable off-state voltages and temperatures. The use of custom-designed differential amplification stages and a voltage-controlled current source enables the accurate characterization of R <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>ON</sub> even on large periphery devices. At first, the proposed setup is tested with a well-established and mature device technology such as a Si MOSFET. Degradation of the R <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>ON</sub> up to 120% due to temperature variation is observed with the presented setup. The setup is then used for the characterization of commercial-grade GaN-on-SiC and GaN-on-Si HEMTs. For both technologies dynamic R <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>ON</sub> degradations up to 75% and 20% are observed for temperature and OFF-state voltage variations, respectively. These characterization data are fundamental for the accurate estimation of conduction losses during the design of switching-mode power converters." @default.
• W2621396681 created "2017-06-09" @default.
• W2621396681 creator A5057371838 @default.
• W2621396681 creator A5087615351 @default.
• W2621396681 creator A5090267500 @default.
• W2621396681 date "2018-04-01" @default.
• W2621396681 modified "2023-09-24" @default.
• W2621396681 title "Dynamic RON Characterization Technique for the Evaluation of Thermal and Off-State Voltage Stress of GaN Switches" @default.
• W2621396681 cites W1495818631 @default.
• W2621396681 cites W1903207445 @default.
• W2621396681 cites W1967672573 @default.
• W2621396681 cites W1973231415 @default.
• W2621396681 cites W1973889505 @default.
• W2621396681 cites W2014864008 @default.
• W2621396681 cites W2017593039 @default.
• W2621396681 cites W2029699094 @default.
• W2621396681 cites W2030889140 @default.
• W2621396681 cites W2064636176 @default.
• W2621396681 cites W2067348957 @default.
• W2621396681 cites W2090609957 @default.
• W2621396681 cites W2092321045 @default.
• W2621396681 cites W2101055757 @default.
• W2621396681 cites W2135331478 @default.
• W2621396681 cites W2137003270 @default.
• W2621396681 cites W2143906132 @default.
• W2621396681 cites W2158437612 @default.
• W2621396681 cites W2164599249 @default.
• W2621396681 cites W2332647933 @default.
• W2621396681 cites W2344720892 @default.
• W2621396681 cites W2473219999 @default.
• W2621396681 cites W2507603061 @default.
• W2621396681 cites W2519239207 @default.
• W2621396681 cites W2564355500 @default.
• W2621396681 doi "https://doi.org/10.1109/tpel.2017.2710281" @default.
• W2621396681 hasPublicationYear "2018" @default.
• W2621396681 type Work @default.
• W2621396681 sameAs 2621396681 @default.
• W2621396681 citedByCount "31" @default.
• W2621396681 countsByYear W26213966812018 @default.
• W2621396681 countsByYear W26213966812019 @default.
• W2621396681 countsByYear W26213966812020 @default.
• W2621396681 countsByYear W26213966812021 @default.
• W2621396681 countsByYear W26213966812022 @default.
• W2621396681 countsByYear W26213966812023 @default.
• W2621396681 crossrefType "journal-article" @default.
• W2621396681 hasAuthorship W2621396681A5057371838 @default.
• W2621396681 hasAuthorship W2621396681A5087615351 @default.
• W2621396681 hasAuthorship W2621396681A5090267500 @default.
• W2621396681 hasBestOaLocation W26213966812 @default.
• W2621396681 hasConcept C119599485 @default.
• W2621396681 hasConcept C127413603 @default.
• W2621396681 hasConcept C162057924 @default.
• W2621396681 hasConcept C165801399 @default.
• W2621396681 hasConcept C171250308 @default.
• W2621396681 hasConcept C172385210 @default.
• W2621396681 hasConcept C184720557 @default.
• W2621396681 hasConcept C192562407 @default.
• W2621396681 hasConcept C24326235 @default.
• W2621396681 hasConcept C2778422915 @default.
• W2621396681 hasConcept C2778871202 @default.
• W2621396681 hasConcept C2779227376 @default.
• W2621396681 hasConcept C41008148 @default.
• W2621396681 hasConcept C49040817 @default.
• W2621396681 hasConceptScore W2621396681C119599485 @default.
• W2621396681 hasConceptScore W2621396681C127413603 @default.
• W2621396681 hasConceptScore W2621396681C162057924 @default.
• W2621396681 hasConceptScore W2621396681C165801399 @default.
• W2621396681 hasConceptScore W2621396681C171250308 @default.
• W2621396681 hasConceptScore W2621396681C172385210 @default.
• W2621396681 hasConceptScore W2621396681C184720557 @default.
• W2621396681 hasConceptScore W2621396681C192562407 @default.
• W2621396681 hasConceptScore W2621396681C24326235 @default.
• W2621396681 hasConceptScore W2621396681C2778422915 @default.
• W2621396681 hasConceptScore W2621396681C2778871202 @default.
• W2621396681 hasConceptScore W2621396681C2779227376 @default.
• W2621396681 hasConceptScore W2621396681C41008148 @default.
• W2621396681 hasConceptScore W2621396681C49040817 @default.
• W2621396681 hasFunder F4320337345 @default.
• W2621396681 hasIssue "4" @default.
• W2621396681 hasLocation W26213966811 @default.
• W2621396681 hasLocation W26213966812 @default.
• W2621396681 hasOpenAccess W2621396681 @default.
• W2621396681 hasPrimaryLocation W26213966811 @default.
• W2621396681 hasRelatedWork W2068645881 @default.
• W2621396681 hasRelatedWork W2081394942 @default.
• W2621396681 hasRelatedWork W2128175041 @default.
• W2621396681 hasRelatedWork W2707943909 @default.
• W2621396681 hasRelatedWork W2898913182 @default.
• W2621396681 hasRelatedWork W3113886925 @default.
• W2621396681 hasRelatedWork W4200168772 @default.
• W2621396681 hasRelatedWork W4200621850 @default.
• W2621396681 hasRelatedWork W4205737017 @default.
• W2621396681 hasRelatedWork W4226474410 @default.
• W2621396681 hasVolume "33" @default.
• W2621396681 isParatext "false" @default.
• W2621396681 isRetracted "false" @default.
• W2621396681 magId "2621396681" @default.
• W2621396681 workType "article" @default.