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- W2649923193 abstract "In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines such as CPW and microstrip on lossless substrates, and to lines on lossy silicon typical of high-speed interconnects including VLSI interconnects. INTRODUCTION We investigate the performance of the calibration comparison method for characteristic impedance determination, which is based on the calibration comparison method of [1] and was introduced in [2] and [3]. We demonstrate the method for different types of planar transmission lines, including VLSI interconnects built in CMOS technology. The method begins with a first-tier multiline TRL calibration [4] in a set of easily characterized reference lines. The reference impedance Zr of this calibration is set to 50 Ω using the method of [5], plus a transmission-line capacitance measurement of a resistor [6]. The reference plane is moved back to a position close to the probe tips. Then, a second-tier multiline TRL calibration in the transmission lines of interest is performed, yielding error boxes that relate the second-tier to the first-tier probe-tip calibration. References [2] and [3] suggest modeling these error boxes with the equivalent circuit shown in Fig. 1, from which a simple and robust estimate of characteristic impedance can be derived that is insensitive to contact-pad parasitics. The model of Fig. 1 consists of a lossy shunt contact-pad with admittance Y followed by an impedance transformer mapping the reference impedance Zr of the probe-tip calibration into the reference impedance Z0 of the second-tier TRL calibration. When transition parasitics are dominated by contact-pad capacitance and conductance, the error box X measured by the calibration comparison method will be approximately equal to X. The transmission matrix X of the circuit in Fig. 1 is" @default.
- W2649923193 created "2017-06-30" @default.
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- W2649923193 date "2002-08-17" @default.
- W2649923193 modified "2023-09-27" @default.
- W2649923193 title "Characteristic Impedance Measurement of Planar Transmission Lines | NIST" @default.
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