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- W2735157430 abstract "In this paper we report experimental results on the fabrication and characterization of vertical Ge gate-all-around p-channel TFETs, utilizing GeSn as a channel material. Through two sample series, the potential and challenges of implementing the low-band gap material GeSn are reviewed. It is verified that ION can be effectively enhanced by increasing the Sn-content in the GeSn-channel, due to increasing tunneling probabilities. Further it is found that when limited to a 10 nm δ-layer, Ge <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0.96</sub> Sn <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0.04</sub> is most beneficial for ION when positioned inside the channel as opposed to in the source, with a maximum of ION = 180 μA/μm at VDS= -2 V and VG = -4 V. Enhanced leakage currents (IOFF), which also degrades the subthreshold swing (SS), is a consequence of a smaller band gap and enhanced defect densities, and represent key challenges with implementing GeSn." @default.
- W2735157430 created "2017-07-21" @default.
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- W2735157430 date "2017-05-01" @default.
- W2735157430 modified "2023-10-14" @default.
- W2735157430 title "Device performance tuning of Ge gate-all-around tunneling field effect transistors by means of GeSn: Potential and challenges" @default.
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- W2735157430 doi "https://doi.org/10.23919/mipro.2017.7973391" @default.
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