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• W2736042893 abstract "Stacking faults expanded by the application of forward current to 4H-SiC p–i–n diodes were observed using a transmission electron microscope to investigate the expansion origin. It was experimentally confirmed that long-zonal-shaped stacking faults expanded from basal-plane dislocations converted into threading edge dislocations. In addition, stacking fault expansion clearly penetrated into the substrate to a greater depth than the dislocation conversion point. This downward expansion of stacking faults strongly depends on the degree of high-density minority carrier injection." @default.
• W2736042893 created "2017-07-21" @default.
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• W2736042893 date "2017-07-11" @default.
• W2736042893 modified "2023-10-01" @default.
• W2736042893 title "Origin analysis of expanded stacking faults by applying forward current to 4H-SiC p–i–n diodes" @default.
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• W2736042893 doi "https://doi.org/10.7567/apex.10.081201" @default.
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