Matches in SemOpenAlex for { <https://semopenalex.org/work/W2737718610> ?p ?o ?g. }
- W2737718610 abstract "Capacitance-voltage ( $C$ – $V$ ) measurement and analysis is highly useful for determining important information about MOS gate stacks. Parameters such as the equivalent oxide thickness (EOT), substrate doping density, flatband voltage, fixed oxide charge, density of interface traps ( ${D}_{ rm {it}}$ ), and effective gate work function can all be extracted from experimental $C$ – $V$ curves. However, to extract these gate-stack parameters accurately, the correct models must be utilized. In Part I, we described the modeling and implementation of a $C$ – $V$ code that can be used for alternative channel semiconductors in conjunction with high- $k$ gate dielectrics and metal gates. Importantly, this new code (CV ACE) includes the effects of nonparabolic bands and quantum capacitance, enabling accurate models to be applied to experimental $C$ – $V$ curves. In this paper, we demonstrate the capabilities of this new code to extract accurate parameters, including EOT and ${D}_{ rm {it}}$ profiles from experimental high- $k$ on Ge and In0.53Ga0.47As gate stacks." @default.
- W2737718610 created "2017-07-31" @default.
- W2737718610 creator A5015072881 @default.
- W2737718610 creator A5030704805 @default.
- W2737718610 creator A5049480520 @default.
- W2737718610 creator A5051272447 @default.
- W2737718610 creator A5051828192 @default.
- W2737718610 creator A5054135802 @default.
- W2737718610 creator A5064829619 @default.
- W2737718610 creator A5077152778 @default.
- W2737718610 creator A5078398095 @default.
- W2737718610 creator A5081155838 @default.
- W2737718610 creator A5089824285 @default.
- W2737718610 creator A5090587628 @default.
- W2737718610 date "2017-09-01" @default.
- W2737718610 modified "2023-09-28" @default.
- W2737718610 title "Comprehensive Capacitance–Voltage Simulation and Extraction Tool Including Quantum Effects for High- $k$ on SixGe1−x and InxGa1−xAs: Part II—Fits and Extraction From Experimental Data" @default.
- W2737718610 cites W1627659639 @default.
- W2737718610 cites W1957052048 @default.
- W2737718610 cites W1976976012 @default.
- W2737718610 cites W1982701132 @default.
- W2737718610 cites W1984466475 @default.
- W2737718610 cites W1984485636 @default.
- W2737718610 cites W1998092820 @default.
- W2737718610 cites W2000520742 @default.
- W2737718610 cites W2001992628 @default.
- W2737718610 cites W2009312684 @default.
- W2737718610 cites W2021795304 @default.
- W2737718610 cites W2031028758 @default.
- W2737718610 cites W2064448201 @default.
- W2737718610 cites W2069357556 @default.
- W2737718610 cites W2070532445 @default.
- W2737718610 cites W2077797393 @default.
- W2737718610 cites W2086126257 @default.
- W2737718610 cites W2086285470 @default.
- W2737718610 cites W2087070363 @default.
- W2737718610 cites W2103160775 @default.
- W2737718610 cites W2115109715 @default.
- W2737718610 cites W2131226291 @default.
- W2737718610 cites W2133088627 @default.
- W2737718610 cites W2155968399 @default.
- W2737718610 cites W2171666183 @default.
- W2737718610 cites W2247912883 @default.
- W2737718610 cites W2256578114 @default.
- W2737718610 cites W2328592251 @default.
- W2737718610 cites W2737751989 @default.
- W2737718610 cites W2955518427 @default.
- W2737718610 cites W44102734 @default.
- W2737718610 doi "https://doi.org/10.1109/ted.2017.2725741" @default.
- W2737718610 hasPublicationYear "2017" @default.
- W2737718610 type Work @default.
- W2737718610 sameAs 2737718610 @default.
- W2737718610 citedByCount "2" @default.
- W2737718610 countsByYear W27377186102017 @default.
- W2737718610 countsByYear W27377186102019 @default.
- W2737718610 crossrefType "journal-article" @default.
- W2737718610 hasAuthorship W2737718610A5015072881 @default.
- W2737718610 hasAuthorship W2737718610A5030704805 @default.
- W2737718610 hasAuthorship W2737718610A5049480520 @default.
- W2737718610 hasAuthorship W2737718610A5051272447 @default.
- W2737718610 hasAuthorship W2737718610A5051828192 @default.
- W2737718610 hasAuthorship W2737718610A5054135802 @default.
- W2737718610 hasAuthorship W2737718610A5064829619 @default.
- W2737718610 hasAuthorship W2737718610A5077152778 @default.
- W2737718610 hasAuthorship W2737718610A5078398095 @default.
- W2737718610 hasAuthorship W2737718610A5081155838 @default.
- W2737718610 hasAuthorship W2737718610A5089824285 @default.
- W2737718610 hasAuthorship W2737718610A5090587628 @default.
- W2737718610 hasConcept C113196181 @default.
- W2737718610 hasConcept C119599485 @default.
- W2737718610 hasConcept C121332964 @default.
- W2737718610 hasConcept C127413603 @default.
- W2737718610 hasConcept C133386390 @default.
- W2737718610 hasConcept C16317505 @default.
- W2737718610 hasConcept C165801399 @default.
- W2737718610 hasConcept C166972891 @default.
- W2737718610 hasConcept C172385210 @default.
- W2737718610 hasConcept C17525397 @default.
- W2737718610 hasConcept C185592680 @default.
- W2737718610 hasConcept C192562407 @default.
- W2737718610 hasConcept C2361726 @default.
- W2737718610 hasConcept C24326235 @default.
- W2737718610 hasConcept C30066665 @default.
- W2737718610 hasConcept C30475298 @default.
- W2737718610 hasConcept C43617362 @default.
- W2737718610 hasConcept C49040817 @default.
- W2737718610 hasConcept C51140833 @default.
- W2737718610 hasConcept C62520636 @default.
- W2737718610 hasConceptScore W2737718610C113196181 @default.
- W2737718610 hasConceptScore W2737718610C119599485 @default.
- W2737718610 hasConceptScore W2737718610C121332964 @default.
- W2737718610 hasConceptScore W2737718610C127413603 @default.
- W2737718610 hasConceptScore W2737718610C133386390 @default.
- W2737718610 hasConceptScore W2737718610C16317505 @default.
- W2737718610 hasConceptScore W2737718610C165801399 @default.
- W2737718610 hasConceptScore W2737718610C166972891 @default.
- W2737718610 hasConceptScore W2737718610C172385210 @default.
- W2737718610 hasConceptScore W2737718610C17525397 @default.
- W2737718610 hasConceptScore W2737718610C185592680 @default.
- W2737718610 hasConceptScore W2737718610C192562407 @default.