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- W2743123198 abstract "Journal Article Automated image acquisition and analysis of beam sensitive samples Get access Eric Stach, Eric Stach Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, USA Search for other works by this author on: Oxford Academic Google Scholar Dmitri N Zakharov, Dmitri N Zakharov Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, USA Search for other works by this author on: Oxford Academic Google Scholar Yuewei Lin, Yuewei Lin Computational Sciences Initiative, Brookhaven National Laboratory, Upton, USA Search for other works by this author on: Oxford Academic Google Scholar Shinjae Yoo, Shinjae Yoo Computational Sciences Initiative, Brookhaven National Laboratory, Upton, USA Search for other works by this author on: Oxford Academic Google Scholar Guenter Resch Guenter Resch Nexperion, e.U., Vienna, Austria Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 1788–1789, https://doi.org/10.1017/S1431927617009606 Published: 04 August 2017" @default.
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- W2743123198 date "2017-07-01" @default.
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- W2743123198 title "Automated image acquisition and analysis of beam sensitive samples" @default.
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- W2743123198 doi "https://doi.org/10.1017/s1431927617009606" @default.
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