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- W2747386961 abstract "We provide a review about the current and previous use of anomalous diffraction of x-rays in the analysis of compound semiconductors. Among the large number of available techniques, those that have been used in successful experiments on this class of compounds are identified. An exhaustive overview of the compound semiconductor systems that have been studied successfully is provided and the kind of results derived from experiments is discussed." @default.
- W2747386961 created "2017-08-31" @default.
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- W2747386961 date "2017-09-11" @default.
- W2747386961 modified "2023-10-03" @default.
- W2747386961 title "The use of anomalous x-ray diffraction as a tool for the analysis of compound semiconductors" @default.
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- W2747386961 doi "https://doi.org/10.1088/1361-6641/aa8708" @default.
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