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- W2758347471 abstract "In this study, the electrical properties of various silicon specimens with different conductivity types and different carrier concentration were characterized, using In-Line Four Probe (ILFP) technique and Resistivity Frequency variation technique (LCR technique) as well. The effect of the frequency on the electrical properties of these samples was also investigated. The results of the study demonstrate some conclusions and recommendations for improving the performance of silicon based solar cells as well as for further development in the field of Si technology." @default.
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- W2758347471 date "2017-08-20" @default.
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- W2758347471 title "The Effect of Frequency of Electromagnetic Waves on Basic Electrical Elements in the Si of LCR Technique" @default.
- W2758347471 doi "https://doi.org/10.20546/ijcrar.2017.508.001" @default.
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