Matches in SemOpenAlex for { <https://semopenalex.org/work/W2758836489> ?p ?o ?g. }
- W2758836489 endingPage "196" @default.
- W2758836489 startingPage "188" @default.
- W2758836489 abstract "Copper is a common impurity in photovoltaic silicon. While reported to precipitate instantly in n-type Si, copper causes light-induced degradation (Cu-LID) in p-type Si. Recently, partial recovery of Cu-LID was observed after only few minutes of dark annealing at 200 °C. In this contribution, we investigate the effects of the dark anneal on Cu-LID-limited minority carrier lifetime both experimentally and by simulations. Surprisingly, after initial recovery, the dark anneal results in further degradation corresponding to a many-fold increase in recombination activity compared to the degraded state after illumination. This anneal-induced degradation can potentially cause additional losses in accidentally Cu-contaminated devices when exposed to elevated temperatures, for example during recovery and regeneration treatments of solar cells. Transient ion drift measurements confirmed that the anneal-induced degradation cannot be attributed to residual interstitial Cu after illumination. After hundreds of hours of annealing, the samples showed another recovery. To analyze these experimental results, a comparison to simulations is performed at the end of the paper." @default.
- W2758836489 created "2017-10-06" @default.
- W2758836489 creator A5016849038 @default.
- W2758836489 creator A5020247093 @default.
- W2758836489 creator A5032823355 @default.
- W2758836489 creator A5043367207 @default.
- W2758836489 creator A5044991330 @default.
- W2758836489 creator A5049882723 @default.
- W2758836489 creator A5058043320 @default.
- W2758836489 creator A5075088857 @default.
- W2758836489 date "2017-09-01" @default.
- W2758836489 modified "2023-09-23" @default.
- W2758836489 title "Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon" @default.
- W2758836489 cites W1558700485 @default.
- W2758836489 cites W1574988328 @default.
- W2758836489 cites W1646851136 @default.
- W2758836489 cites W1970164715 @default.
- W2758836489 cites W1970562471 @default.
- W2758836489 cites W1978358898 @default.
- W2758836489 cites W2002296532 @default.
- W2758836489 cites W2014388104 @default.
- W2758836489 cites W2015348449 @default.
- W2758836489 cites W2020180970 @default.
- W2758836489 cites W2020259802 @default.
- W2758836489 cites W2033227672 @default.
- W2758836489 cites W2051910110 @default.
- W2758836489 cites W2053529674 @default.
- W2758836489 cites W2057476555 @default.
- W2758836489 cites W2059439522 @default.
- W2758836489 cites W2080979315 @default.
- W2758836489 cites W2087128611 @default.
- W2758836489 cites W2103248007 @default.
- W2758836489 cites W2110118309 @default.
- W2758836489 cites W2131057823 @default.
- W2758836489 cites W2151225224 @default.
- W2758836489 cites W2156806959 @default.
- W2758836489 cites W2165837573 @default.
- W2758836489 cites W2200447917 @default.
- W2758836489 cites W2253312445 @default.
- W2758836489 cites W2305049751 @default.
- W2758836489 cites W2314890100 @default.
- W2758836489 cites W2398541851 @default.
- W2758836489 cites W2525697801 @default.
- W2758836489 cites W2568019268 @default.
- W2758836489 cites W2581905081 @default.
- W2758836489 cites W2587257332 @default.
- W2758836489 cites W2608413531 @default.
- W2758836489 cites W2614200221 @default.
- W2758836489 cites W2615546348 @default.
- W2758836489 cites W2621921227 @default.
- W2758836489 cites W853947715 @default.
- W2758836489 doi "https://doi.org/10.1016/j.egypro.2017.09.314" @default.
- W2758836489 hasPublicationYear "2017" @default.
- W2758836489 type Work @default.
- W2758836489 sameAs 2758836489 @default.
- W2758836489 citedByCount "1" @default.
- W2758836489 countsByYear W27588364892020 @default.
- W2758836489 crossrefType "journal-article" @default.
- W2758836489 hasAuthorship W2758836489A5016849038 @default.
- W2758836489 hasAuthorship W2758836489A5020247093 @default.
- W2758836489 hasAuthorship W2758836489A5032823355 @default.
- W2758836489 hasAuthorship W2758836489A5043367207 @default.
- W2758836489 hasAuthorship W2758836489A5044991330 @default.
- W2758836489 hasAuthorship W2758836489A5049882723 @default.
- W2758836489 hasAuthorship W2758836489A5058043320 @default.
- W2758836489 hasAuthorship W2758836489A5075088857 @default.
- W2758836489 hasBestOaLocation W27588364891 @default.
- W2758836489 hasConcept C104317684 @default.
- W2758836489 hasConcept C107872376 @default.
- W2758836489 hasConcept C113196181 @default.
- W2758836489 hasConcept C127413603 @default.
- W2758836489 hasConcept C156695909 @default.
- W2758836489 hasConcept C178790620 @default.
- W2758836489 hasConcept C185592680 @default.
- W2758836489 hasConcept C191897082 @default.
- W2758836489 hasConcept C192562407 @default.
- W2758836489 hasConcept C198865614 @default.
- W2758836489 hasConcept C24326235 @default.
- W2758836489 hasConcept C2777855556 @default.
- W2758836489 hasConcept C2779679103 @default.
- W2758836489 hasConcept C49040817 @default.
- W2758836489 hasConcept C544778455 @default.
- W2758836489 hasConcept C544956773 @default.
- W2758836489 hasConcept C55493867 @default.
- W2758836489 hasConcept C71987851 @default.
- W2758836489 hasConceptScore W2758836489C104317684 @default.
- W2758836489 hasConceptScore W2758836489C107872376 @default.
- W2758836489 hasConceptScore W2758836489C113196181 @default.
- W2758836489 hasConceptScore W2758836489C127413603 @default.
- W2758836489 hasConceptScore W2758836489C156695909 @default.
- W2758836489 hasConceptScore W2758836489C178790620 @default.
- W2758836489 hasConceptScore W2758836489C185592680 @default.
- W2758836489 hasConceptScore W2758836489C191897082 @default.
- W2758836489 hasConceptScore W2758836489C192562407 @default.
- W2758836489 hasConceptScore W2758836489C198865614 @default.
- W2758836489 hasConceptScore W2758836489C24326235 @default.
- W2758836489 hasConceptScore W2758836489C2777855556 @default.
- W2758836489 hasConceptScore W2758836489C2779679103 @default.