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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2759064100> ?p ?o ?g. }

• W2759064100 endingPage "733" @default.
• W2759064100 startingPage "726" @default.
• W2759064100 abstract "Carrier-induced degradation (CID) of multi-crystalline silicon (mc-Si) wafers is a major problem currently affecting the photovoltaic industry. A large number of studies investigating this phenomenon have provided important clues regarding the identification of the defect, however, as of yet, none have isolated a specific cause. In this work, we provide further insight into the kinetics of CID in mc-Si by presenting a detailed study of the impact of dark annealing on the formation and subsequent mitigation of the carrier-induced defect. Previous work has shown that such anneals can modulate the kinetics of the defect. Here, we extend that work and demonstrate that dark annealing can result in accelerated defect formation and extended degradation throughout a subsequent light soaking cycle, irrespective to when the dark annealing was applied. It is suggested that dark annealing could release extra defect precursors into mc-Si, which then become recombination active upon illumination. Therefore, the subsequent degradation after dark annealing might not necessary involve a reverse reaction. Through multiple dark anneal and light soak cycles, the extent of degradation in each cycle continues to reduce. A direct reverse reaction (de-stabilisation) alone does not explain this observation. We suggest that this effect could be explained by the presence of a reservoir of defect precursors, which are gradually depleted throughout the dark annealing processes. Finally, it is demonstrated that dark annealing alone could potentially cause a similar degradation to illumination at elevated temperature." @default.
• W2759064100 created "2017-10-06" @default.
• W2759064100 creator A5007114516 @default.
• W2759064100 creator A5011045221 @default.
• W2759064100 creator A5040454158 @default.
• W2759064100 creator A5058802383 @default.
• W2759064100 creator A5083808939 @default.
• W2759064100 creator A5090822936 @default.
• W2759064100 date "2017-09-01" @default.
• W2759064100 modified "2023-09-26" @default.
• W2759064100 title "Impact of annealing on the formation and mitigation of carrier-induced defects in multi-crystalline silicon" @default.
• W2759064100 cites W1155446672 @default.
• W2759064100 cites W1988847084 @default.
• W2759064100 cites W2026166860 @default.
• W2759064100 cites W2253312445 @default.
• W2759064100 cites W2402239793 @default.
• W2759064100 cites W2409159569 @default.
• W2759064100 cites W2513596354 @default.
• W2759064100 cites W2521420879 @default.
• W2759064100 cites W2521492503 @default.
• W2759064100 cites W2521724149 @default.
• W2759064100 cites W2522343011 @default.
• W2759064100 cites W2522633881 @default.
• W2759064100 cites W2523451911 @default.
• W2759064100 cites W2542171563 @default.
• W2759064100 cites W2555780712 @default.
• W2759064100 cites W789546306 @default.
• W2759064100 doi "https://doi.org/10.1016/j.egypro.2017.09.087" @default.
• W2759064100 hasPublicationYear "2017" @default.
• W2759064100 type Work @default.
• W2759064100 sameAs 2759064100 @default.
• W2759064100 citedByCount "24" @default.
• W2759064100 countsByYear W27590641002017 @default.
• W2759064100 countsByYear W27590641002018 @default.
• W2759064100 countsByYear W27590641002019 @default.
• W2759064100 countsByYear W27590641002020 @default.
• W2759064100 countsByYear W27590641002021 @default.
• W2759064100 countsByYear W27590641002022 @default.
• W2759064100 crossrefType "journal-article" @default.
• W2759064100 hasAuthorship W2759064100A5007114516 @default.
• W2759064100 hasAuthorship W2759064100A5011045221 @default.
• W2759064100 hasAuthorship W2759064100A5040454158 @default.
• W2759064100 hasAuthorship W2759064100A5058802383 @default.
• W2759064100 hasAuthorship W2759064100A5083808939 @default.
• W2759064100 hasAuthorship W2759064100A5090822936 @default.
• W2759064100 hasBestOaLocation W27590641001 @default.
• W2759064100 hasConcept C119599485 @default.
• W2759064100 hasConcept C121332964 @default.
• W2759064100 hasConcept C127413603 @default.
• W2759064100 hasConcept C148898269 @default.
• W2759064100 hasConcept C159467904 @default.
• W2759064100 hasConcept C159985019 @default.
• W2759064100 hasConcept C160671074 @default.
• W2759064100 hasConcept C180651308 @default.
• W2759064100 hasConcept C185592680 @default.
• W2759064100 hasConcept C192562407 @default.
• W2759064100 hasConcept C23125352 @default.
• W2759064100 hasConcept C2777855556 @default.
• W2759064100 hasConcept C2779667780 @default.
• W2759064100 hasConcept C41291067 @default.
• W2759064100 hasConcept C42360764 @default.
• W2759064100 hasConcept C49040817 @default.
• W2759064100 hasConcept C544956773 @default.
• W2759064100 hasConcept C62520636 @default.
• W2759064100 hasConceptScore W2759064100C119599485 @default.
• W2759064100 hasConceptScore W2759064100C121332964 @default.
• W2759064100 hasConceptScore W2759064100C127413603 @default.
• W2759064100 hasConceptScore W2759064100C148898269 @default.
• W2759064100 hasConceptScore W2759064100C159467904 @default.
• W2759064100 hasConceptScore W2759064100C159985019 @default.
• W2759064100 hasConceptScore W2759064100C160671074 @default.
• W2759064100 hasConceptScore W2759064100C180651308 @default.
• W2759064100 hasConceptScore W2759064100C185592680 @default.
• W2759064100 hasConceptScore W2759064100C192562407 @default.
• W2759064100 hasConceptScore W2759064100C23125352 @default.
• W2759064100 hasConceptScore W2759064100C2777855556 @default.
• W2759064100 hasConceptScore W2759064100C2779667780 @default.
• W2759064100 hasConceptScore W2759064100C41291067 @default.
• W2759064100 hasConceptScore W2759064100C42360764 @default.
• W2759064100 hasConceptScore W2759064100C49040817 @default.
• W2759064100 hasConceptScore W2759064100C544956773 @default.
• W2759064100 hasConceptScore W2759064100C62520636 @default.
• W2759064100 hasLocation W27590641001 @default.
• W2759064100 hasOpenAccess W2759064100 @default.
• W2759064100 hasPrimaryLocation W27590641001 @default.
• W2759064100 hasRelatedWork W2063388817 @default.
• W2759064100 hasRelatedWork W2083874984 @default.
• W2759064100 hasRelatedWork W2088067044 @default.
• W2759064100 hasRelatedWork W2130583547 @default.
• W2759064100 hasRelatedWork W2255666402 @default.
• W2759064100 hasRelatedWork W2355627476 @default.
• W2759064100 hasRelatedWork W2804442816 @default.
• W2759064100 hasRelatedWork W2995618596 @default.
• W2759064100 hasRelatedWork W2999476287 @default.
• W2759064100 hasRelatedWork W2149642111 @default.
• W2759064100 hasVolume "124" @default.
• W2759064100 isParatext "false" @default.
• W2759064100 isRetracted "false" @default.

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