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- W2759598889 abstract "MOSFET radio-frequency characterization and modeling is studied, both with SOI CMOS and bulk CMOS technologies. The network analyzer measurement uncertainties are studied, as is their effect on the small signal parameter extraction of MOS devices. These results can be used as guidelines for designing MOS RF characterization layouts with as small an AC extraction error as possible. The results can also be used in RF model extraction as criteria for required optimization accuracy. Modifications to the digital CMOS model equivalent circuit are studied to achieve better RF behavior for the MOS model. The benefit of absorbing the drain and source parasitic series resistances into the current description is evaluated. It seems that correct high-frequency behavior is not possible to describe using this technique. The series resistances need to be defined extrinsically. Different bulk network alternatives were evaluated using scalable device models up to 10 GHz. Accurate output impedance behavior of the model requires a bulk resistance network. It seems that good accuracy improvement is achieved with just a single bulk resistor. Additional improvement is achieved by increasing the number of resistors to three. At this used frequency range no further accuracy improvement was achieved by increasing the resistor amount over three. Two modeling approaches describing the distributed gate behavior are also studied with different MOS transistor layouts. Both approaches improve the RF characteristics to some extent but with limited device geometry. Both distributed gate models describe well the high frequency device behavior of devices not commonly used at radio frequencies." @default.
- W2759598889 created "2017-10-06" @default.
- W2759598889 creator A5039538793 @default.
- W2759598889 date "2007-06-18" @default.
- W2759598889 modified "2023-09-24" @default.
- W2759598889 title "MOSFET RF characterization using bulk and SOI CMOS technologies" @default.
- W2759598889 cites W1483984940 @default.
- W2759598889 cites W1492337098 @default.
- W2759598889 cites W1533614470 @default.
- W2759598889 cites W1538074801 @default.
- W2759598889 cites W1538983215 @default.
- W2759598889 cites W1550857075 @default.
- W2759598889 cites W1564201208 @default.
- W2759598889 cites W1594898082 @default.
- W2759598889 cites W1751580316 @default.
- W2759598889 cites W179312406 @default.
- W2759598889 cites W1896485332 @default.
- W2759598889 cites W1898195374 @default.
- W2759598889 cites W1919997397 @default.
- W2759598889 cites W1937060092 @default.
- W2759598889 cites W1980460888 @default.
- W2759598889 cites W1999129699 @default.
- W2759598889 cites W2023817611 @default.
- W2759598889 cites W2024509638 @default.
- W2759598889 cites W2028701445 @default.
- W2759598889 cites W2031218729 @default.
- W2759598889 cites W2040457706 @default.
- W2759598889 cites W2044192818 @default.
- W2759598889 cites W2059377276 @default.
- W2759598889 cites W2059868280 @default.
- W2759598889 cites W2062327827 @default.
- W2759598889 cites W2072707442 @default.
- W2759598889 cites W2086880062 @default.
- W2759598889 cites W2097327696 @default.
- W2759598889 cites W2097978076 @default.
- W2759598889 cites W2098206964 @default.
- W2759598889 cites W2100309963 @default.
- W2759598889 cites W2101394188 @default.
- W2759598889 cites W2103686787 @default.
- W2759598889 cites W2105492376 @default.
- W2759598889 cites W2107145587 @default.
- W2759598889 cites W2108952645 @default.
- W2759598889 cites W2109786990 @default.
- W2759598889 cites W2114930898 @default.
- W2759598889 cites W2117968251 @default.
- W2759598889 cites W2119909760 @default.
- W2759598889 cites W2122511055 @default.
- W2759598889 cites W2124259293 @default.
- W2759598889 cites W2124725014 @default.
- W2759598889 cites W2124848329 @default.
- W2759598889 cites W2128663755 @default.
- W2759598889 cites W2129859876 @default.
- W2759598889 cites W2130257804 @default.
- W2759598889 cites W2131947274 @default.
- W2759598889 cites W2133216057 @default.
- W2759598889 cites W2133629759 @default.
- W2759598889 cites W2136184610 @default.
- W2759598889 cites W2136612137 @default.
- W2759598889 cites W2142245099 @default.
- W2759598889 cites W2142776895 @default.
- W2759598889 cites W2144081487 @default.
- W2759598889 cites W2144546776 @default.
- W2759598889 cites W2144762594 @default.
- W2759598889 cites W2146719578 @default.
- W2759598889 cites W2147353017 @default.
- W2759598889 cites W2150752826 @default.
- W2759598889 cites W2153290873 @default.
- W2759598889 cites W2154417099 @default.
- W2759598889 cites W2155476815 @default.
- W2759598889 cites W2156873027 @default.
- W2759598889 cites W2158408301 @default.
- W2759598889 cites W2158690805 @default.
- W2759598889 cites W2158822804 @default.
- W2759598889 cites W2158870657 @default.
- W2759598889 cites W2160910336 @default.
- W2759598889 cites W2161141317 @default.
- W2759598889 cites W2163768806 @default.
- W2759598889 cites W2164262445 @default.
- W2759598889 cites W2170662476 @default.
- W2759598889 cites W2170688190 @default.
- W2759598889 cites W2172274054 @default.
- W2759598889 cites W2533744699 @default.
- W2759598889 cites W2536023785 @default.
- W2759598889 cites W2543159125 @default.
- W2759598889 cites W2545581946 @default.
- W2759598889 cites W2545600579 @default.
- W2759598889 cites W2545686791 @default.
- W2759598889 cites W2547367084 @default.
- W2759598889 cites W2561056470 @default.
- W2759598889 cites W2562694321 @default.
- W2759598889 cites W2984266279 @default.
- W2759598889 cites W3215090698 @default.
- W2759598889 cites W3217214766 @default.
- W2759598889 hasPublicationYear "2007" @default.
- W2759598889 type Work @default.
- W2759598889 sameAs 2759598889 @default.
- W2759598889 citedByCount "14" @default.
- W2759598889 countsByYear W27595988892012 @default.
- W2759598889 countsByYear W27595988892013 @default.
- W2759598889 countsByYear W27595988892015 @default.