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• W2767253766 abstract "Abstract We fabricated Cu2SnSe3 thin film on a Mo-coated soda-lime glass substrate by a co-evaporation method. The X-ray diffraction pattern revealed the formation of polycrystalline Cu2SnSe3 with a monoclinic structure (space group Cc). Raman scattering measurements were also performed on the thin film at a pressure ranging from 1 atm to 7.01 GPa. The Raman spectrum was resolved into 4 Lorentzian peaks observed at 184 cm− 1, 206 cm− 1, 236 cm− 1, and 252 cm− 1 at 1 atm, which correspond to A′, A″, A″, and A′ symmetry, respectively. The effects of pressure on these Raman-active phonon modes were discussed. The measured elastic properties of Cu2SnSe3 under high pressure were also compared with those of Cu2ZnSnSe4." @default.
• W2767253766 created "2017-11-17" @default.
• W2767253766 creator A5034336620 @default.
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• W2767253766 date "2018-02-01" @default.
• W2767253766 modified "2023-10-18" @default.
• W2767253766 title "High pressure Raman scattering of a co-evaporated Cu2SnSe3 thin film" @default.
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• W2767253766 doi "https://doi.org/10.1016/j.tsf.2017.11.014" @default.
• W2767253766 hasPublicationYear "2018" @default.
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