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- W2767798807 abstract "A fully automatic test system for characterizing advanced probe cards able to probe on large-array fine-pitch micro-bumps (such as JEDEC's Wide-I/O Mobile DRAM interfaces [1, 2]) has been specified, developed, installed, and brought to a full-operational state. The system is based on a Cascade CM300 probe station from FormFactor and National Instruments PXI test instrumentation and complemented by in-house developed software for automatic test generation and data analysis and visualization. The system is successfully used in conjunction with FormFactor's Pyramid Probe <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>®</sup> RBI probe-card technology on WIO1 and WIO2 micro-bump arrays on 0300mm wafers designed and manufactured by IMEC. This paper describes the various system components in hardware and software, and experimental results obtained with several test wafers." @default.
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- W2767798807 date "2017-09-01" @default.
- W2767798807 modified "2023-10-04" @default.
- W2767798807 title "A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards" @default.
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- W2767798807 doi "https://doi.org/10.1109/itc-asia.2017.8097130" @default.
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