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- W2771207693 abstract "Designing high-voltage insulation it is a main prohlem to determine the withstand voltage and the minimum life time. As a rule extrapolation hased on experimental mean values and variances (e.g. Three-Sigma Law) is used for determining the respective voltage level or life-time. For practical reasons only a limited numher of voltage tests may be carried out. Therefore the experimental results of small sample sizes are only the most probable inference of the actual values. Given a normal or transformed normal distribution of the measured values diagrams of the tolerance limits for the actual withstand voltage and minimum life-time have been developed using the non-central t-distribution. The application of this stochastic modelling technique permits a much preciser determination of the tolerance limits than the Kolmogorov-Smirnov goodness of fit test or conventional worst case design based on the central-t and Chi2-distribution." @default.
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- W2771207693 date "1983-01-01" @default.
- W2771207693 modified "2023-09-26" @default.
- W2771207693 title "Rish Assessment Of High-Voltage Insulation Based On Stochastic Modelling" @default.
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- W2771207693 doi "https://doi.org/10.1080/02286203.1983.11759837" @default.
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